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ジャーナル論文(6)
キーワード
gallium nitride (6)
transmission electron microscopy (2)
FNO (1)
GaN (1)
HAXPES (1)
activation (1)
atom probe tomography (1)
defect passivation (1)
fluorination (1)
nitrosyl fluoride (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (2)
In Copyright (2)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
ファイル種別
application/pdf (6)
キーワード: gallium nitride
全ての絞り込みを解除
6 件のレコードが見つかりました。
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
ジャーナル論文
著者
Takahiro Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
NIMS Researchers Directory SAMURAI
Takahiro Nagata
;
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Takashi Teramoto
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
Takashi Teramoto
;
Dominic Gerlach
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
Dominic Gerlach
;
Peng Shen
(author) (
この著者で検索
)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
Peng Shen
;
Shigenori Ueda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Takako Kimura
(author) (
この著者で検索
)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
Takako Kimura
;
Christian Dussarrat
(author) (
この著者で検索
)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
Christian Dussarrat
;
Toyohiro Chikyow
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3860-4806
NIMS Researchers Directory SAMURAI
Toyohiro Chikyow
キーワード
gallium nitride
,
GaN
,
nitrosyl fluoride
,
FNO
,
HAXPES
,
defect passivation
,
fluorination
刊行年月日
2025-03-07
更新時刻
2025-03-26 17:26:31 +0900
Annealing properties of vacancy-type defects in ion implanted GaN during ultra-high-pressure annealing studied by using a monoenergetic positron beam
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
Akira Uedono
;
Hideki Sakurai
(author) (
この著者で検索
)
Hideki Sakurai
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Shoji Ishibashi
(author) (
この著者で検索
)
Shoji Ishibashi
;
Shigefusa F. Chichibu
(author) (
この著者で検索
)
Shigefusa F. Chichibu
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Jun Suda
(author) (
この著者で検索
)
Jun Suda
;
Tadakatsu Ohokubo
(author) (
この著者で検索
)
Tadakatsu Ohokubo
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
Nobuyuki Ikarashi
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
キーワード
gallium nitride
,
vacancy
,
positron
刊行年月日
2023-03-15
更新時刻
2024-01-05 22:12:35 +0900
Atomic-scale observation of native oxides on
c
- and
m
-faced GaN surfaces
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Yoshihiro Irokawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-6531-4356
NIMS Researchers Directory SAMURAI
Yoshihiro Irokawa
;
Toshihide Nabatame
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5973-0230
NIMS Researchers Directory SAMURAI
Toshihide Nabatame
;
Yasuo Koide
(author) (
この著者で検索
)
Yasuo Koide
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
キーワード
transmission electron microscopy
,
gallium nitride
刊行年月日
2026-04-01
更新時刻
2026-04-02 10:10:21 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Kyosuke Sawabe
(author) (
この著者で検索
)
Kyosuke Sawabe
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Acceptor activation of Mg-doped GaN—Effects of N2/O2 vs N2 as ambient gas during annealing
ジャーナル論文
著者
Ashutosh Kumar
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
Ashutosh Kumar
;
Martin Berg
(author) (
この著者で検索
)
Martin Berg
;
Qin Wang
(author) (
この著者で検索
)
Qin Wang
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Michael Salter
(author) (
この著者で検索
)
Michael Salter
;
Peter Ramvall
(author) (
この著者で検索
)
Peter Ramvall
キーワード
gallium nitride
,
scanning transmission electron microscopy
,
semiconductor
,
activation
刊行年月日
2023-07-21
更新時刻
2024-01-05 22:12:15 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Ryo Tanaka
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
Shinya Takashima
;
Katsunori Ueno
(author) (
この著者で検索
)
Katsunori Ueno
;
Masaharu Edo
(author) (
この著者で検索
)
Masaharu Edo
;
Kohei Shima
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
Michal Bockowski
キーワード
gallium nitride
刊行年月日
2024-02-29
更新時刻
2025-03-01 12:30:45 +0900
キーワード
gallium nitride
(6)
transmission electron microscopy
(2)
FNO
(1)
GaN
(1)
HAXPES
(1)
activation
(1)
atom probe tomography
(1)
defect passivation
(1)
fluorination
(1)
nitrosyl fluoride
(1)
positron
(1)
scanning transmission electron microscopy
(1)
semiconductor
(1)
vacancy
(1)
RDEメタデータ定義
RDE送り状
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1
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