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Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Yoshikawa, Hideki (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
- キーワード
- Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:28 +0900
Large voltage-controlled magnetic anisotropy effect in magnetic tunnel junctions prepared by deposition at cryogenic temperatures
- ジャーナル論文
- 著者
-
;Takayuki Nozaki (author) (この著者で検索);Tomohiro Ichinose (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Tatsuya Yamamoto (author) (この著者で検索);Makoto Konoto (author) (この著者で検索);Kay Yakushiji (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Shinji Yuasa (author) (この著者で検索)
- キーワード
- Spintronics
- 刊行年月日
- 2023-12-01
- 更新時刻
- 2024-01-10 10:39:02 +0900
Effectiveness of fluorine termination at nitrogen vacancies inside gallium nitride crystals based on first-principles calculations
- ジャーナル論文
- 著者
-
Yuki Fujishiro (author) (この著者で検索)
https://orcid.org/0009-0006-7436-2911
(unauthenticated)
;
Tomoe Yayama (author) (この著者で検索)
https://orcid.org/0000-0002-5708-8723
(unauthenticated)
;
Takahiro Nagata (author) (この著者で検索)
;
Toyohiro Chikyow (author) (この著者で検索)
;
Fumiko Akagi (author) (この著者で検索)
https://orcid.org/0000-0003-4934-8465
(unauthenticated)
- キーワード
- Gallium nitride, First-principles calculations, Fluorine termination, Nitrogen vacancies
- 刊行年月日
- 2026-02-28
- 更新時刻
- 2026-04-03 10:13:47 +0900
Current-induced brightening of vacancy-related emitters in hexagonal boron nitride
- ジャーナル論文
- 著者
-
;Corinne Steiner (author) (この著者で検索);Rebecca Rahmel (author) (この著者で検索);Frank Volmer (author) (この著者で検索);Rika Windisch (author) (この著者で検索);Lars H. Janssen (author) (この著者で検索);Patricia Pesch (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
;
Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
;Florian Libisch (author) (この著者で検索);Bernd Beschoten (author) (この著者で検索);Christoph Stampfer (author) (この著者で検索)Annika Kurzmann (author) (この著者で検索)
- キーワード
- hexagonal boron nitride, vacancy-related emitters , photoluminescence
- 刊行年月日
- 2025-08-19
- 更新時刻
- 2026-02-16 16:31:11 +0900
Discharge Rate‐Driven Li2O2 Growth Exhibits Unconventional Morphology Trends in Solid‐State Li‐O2 Batteries
- ジャーナル論文
- 著者
-
;Xiaozhou Huang (author) (この著者で検索);Matthew Li (author) (この著者で検索)Yanan Gao (author) (この著者で検索)
;
;Moon Gyu Park (author) (この著者で検索)Shoichi Matsuda (author) (この著者で検索)
;
Khalil Amine (author) (この著者で検索)
https://orcid.org/0000-0001-9206-3719
(unauthenticated)
- キーワード
- Solid-State Li-O2 Batteries
- 刊行年月日
- 2025-09-08
- 更新時刻
- 2025-09-24 12:30:27 +0900
Suppression of symmetry-breaking correlated insulators in a rhombohedral trilayer graphene superlattice
- ジャーナル論文
- 著者
-
;Xiangyan Han (author) (この著者で検索);Yuting Zou (author) (この著者で検索);Qianling Liu (author) (この著者で検索);Zhiyu Wang (author) (この著者で検索);Ruirui Niu (author) (この著者で検索);Zhuangzhuang Qu (author) (この著者で検索);Zhuoxian Li (author) (この著者で検索)Chunrui Han (author) (この著者で検索)
https://orcid.org/0000-0002-6257-1103
(unauthenticated)
;
Kenji Watanabe (author) (この著者で検索)
;
Takashi Taniguchi (author) (この著者で検索)
;
;Baojuan Dong (author) (この著者で検索);Zhida Song (author) (この著者で検索)Jinhai Mao (author) (この著者で検索)
https://orcid.org/0000-0002-9034-3642
(unauthenticated)
;
Zheng Han (author) (この著者で検索)
https://orcid.org/0000-0001-5721-6206
(unauthenticated)
;
Zhi Gang Cheng (author) (この著者で検索)
https://orcid.org/0000-0002-9449-6734
(unauthenticated)
;
;Zizhao Gan (author) (この著者で検索)Jianming Lu (author) (この著者で検索)
https://orcid.org/0000-0002-1558-4040
(unauthenticated)
- キーワード
- Isospin flavor polarization, rhombohedral trilayer graphene, symmetry-breaking phases
- 刊行年月日
- 2024-11-11
- 更新時刻
- 2025-02-06 12:30:53 +0900