4 件のレコードが見つかりました。
Vacancy-type defects introduced by mechanical polishing in ammonothermal GaN studied by a monoenergetic positron beam
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
Kohei Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
;Shigefusa F. Chichibu (author) (この著者で検索)Kacper Sierakowski (author) (この著者で検索)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
;
Makoto Oishi (author) (この著者で検索)
https://orcid.org/0000-0003-3402-4556
(unauthenticated)
;
Noriyuki Okada (author) (この著者で検索)
https://orcid.org/0009-0002-0090-5646
(unauthenticated)
;
Takuro Nagai (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- Mechanical polishing, GaN, Vacancy, Defect, Positron annihilation
- 刊行年月日
- 2026-04-12
- 更新時刻
- 2026-04-20 08:56:29 +0900
Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by Using a Monoenergetic Positron Beam
- ジャーナル論文
- 著者
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A. Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
R. Tanaka (author) (この著者で検索)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
;
S. Takashima (author) (この著者で検索)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
;
;K. Ueno (author) (この著者で検索);M. Edo (author) (この著者で検索)K. Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
;S. F. Chichibu (author) (この著者で検索)J. Uzuhashi (author) (この著者で検索)
;
T. Ohkubo (author) (この著者で検索)
;
S. Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
;K. Sierakowski (author) (この著者で検索)M. Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- gallium nitride
- 刊行年月日
- 2025-08-27
- 更新時刻
- 2026-01-05 13:57:59 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Claudia Fleischmann (author) (この著者で検索)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
;
;Jean-Philippe Soulié (author) (この著者で検索);Mustafa Ayyad (author) (この著者で検索)Jeroen E. Scheerder (author) (この著者で検索)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
;
;Christoph Adelmann (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Koji Michishio (author) (この著者で検索)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
;
;Nagayasu Oshima (author) (この著者で検索)Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- キーワード
- atom probe tomography, positron annihilation
- 刊行年月日
- 2024-07-10
- 更新時刻
- 2025-07-10 08:30:19 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
- ジャーナル論文
- 著者
-
Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Ryo Tanaka (author) (この著者で検索)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
;
Shinya Takashima (author) (この著者で検索)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
;
;Katsunori Ueno (author) (この著者で検索);Masaharu Edo (author) (この著者で検索)Kohei Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
Shigefusa F. Chichibu (author) (この著者で検索)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
Kacper Sierakowski (author) (この著者で検索)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
;
Michal Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- gallium nitride
- 刊行年月日
- 2024-02-29
- 更新時刻
- 2025-03-01 12:30:45 +0900