キーワード: scanning transmission electron microscopy

5 件のレコードが見つかりました。

kikkawa-et-al-2025-observation-of-boron-vacancy-concentration-in-hexagonal-boron-nitride-at-nanometer-scale.pdf
Observation of Boron Vacancy Concentration in Hexagonal Boron Nitride at Nanometer Scale
ジャーナル論文
著者
Jun Kikkawa (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials/Advanced Materials Characterization Field/Electron Microscopy Group
ORCID SAMURAI ;
Chikara Shinei (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Yuta Masuyama (author) (この著者で検索)
National Institutes for Quantum Science and Technology
;
Yuichi Yamazaki (author) (この著者で検索)
National Institutes for Quantum Science and Technology
;
Teruyasu Mizoguchi (author) (この著者で検索)
Univ. Tokyo, Institute for Industrial Science
;
Koji Kimoto (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials
ORCID SAMURAI ;
Takashi Taniguchi (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)
ORCID SAMURAI ;
Tokuyuki Teraji (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI
キーワード
hexagonal boronnitride, boron vacancy, electron energy loss spectroscopy, scanning transmission electron microscopy, frist-principles simulation
刊行年月日
2025-09-03
更新時刻
2025-09-08 13:41:17 +0900

Advanced Materials - 2024 - Thomsen - Direct Visualization of Defect‐Controlled Diffusion in van der Waals Gaps.pdf
Direct Visualization of Defect‐Controlled Diffusion in van der Waals Gaps
ジャーナル論文
著者
Joachim Dahl Thomsen (author) (この著者で検索)
;
Yaxian Wang (author) (この著者で検索)
;
Henrik Flyvbjerg (author) (この著者で検索)
;
Eugene Park (author) (この著者で検索)
;
Kenji Watanabe (author) (この著者で検索)
ORCID SAMURAI ;
Takashi Taniguchi (author) (この著者で検索)
ORCID SAMURAI ;
Prineha Narang (author) (この著者で検索)
;
Frances M. Ross (author) (この著者で検索)
キーワード
Defect-Controlled atomic Diffusion, van der Waals (vdW) gaps, scanning transmission electron microscopy
刊行年月日
2024-08-04
更新時刻
2026-02-14 22:51:07 +0900

1-s2.0-S0968432825001064-main (final).pdf
Liquid-cell annular dark-field scanning transmission electron microscopy imaging of single crystal samples on a low-index zone-axis incidence condition
ジャーナル論文
著者
Masaki Takeguchi (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
ORCID SAMURAI ;
Jonathan Lueke (author) (この著者で検索)
Norcada (Canada)
;
Matthew Reynolds (author) (この著者で検索)
Norcada (Canada)
;
Baibing Zhao (author) (この著者で検索)
KITANO SEIKI Ltd
;
Ayako Hashimoto (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
ORCID SAMURAI
キーワード
liquid-cell, scanning transmission electron microscopy, zone-axis incidence, atomic resolution
刊行年月日
2025-07-17
更新時刻
2025-10-01 12:30:18 +0900

Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
ORCID SAMURAI ;
Ashutosh Kumar (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Wei Yi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Tadakatsu Ohkubo (author) (この著者で検索)
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
;
Shinya Takashima (author) (この著者で検索)
;
Masaharu Edo (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Kazuhiro Hono (author) (この著者で検索)
ORCID SAMURAI
キーワード
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900

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