Masaki Takeguchi
(Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science)
;
Jonathan Lueke
(Norcada (Canada))
;
Matthew Reynolds
(Norcada (Canada))
;
Baibing Zhao
(KITANO SEIKI Ltd)
;
Ayako Hashimoto
(Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science)
説明:
(abstract)e report the development of a double-tilt LC holder for atomic-resolution LC-ADF-STEM imaging of single-crystal samples under zone-axis incidence conditions. A SrTiO3 <001> lamellar sample, approximately 100 nm thick, was prepared using the focused ion beam technique and transferred onto a silicon nitride window membrane of an LC chip via a glass probe pick-up method in air, which avoids Ga ion beam-induced damage to the window membrane. The sample and pure water were enclosed in an LC and observed under <001> zone-axis incidence conditions using aberration-corrected ADF-STEM. Electron channeling along the atomic columns enabled atomic-resolution LC-ADF-STEM imaging with high contrast, sufficiently overcoming background signals from window membranes and liquids.
権利情報:
キーワード: liquid-cell, scanning transmission electron microscopy, zone-axis incidence, atomic resolution
刊行年月日: 2025-07-17
出版者: Elsevier BV
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1016/j.micron.2025.103888
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-10-01 12:30:18 +0900
MDRでの公開時刻: 2025-10-01 12:19:15 +0900
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1-s2.0-S0968432825001064-main (final).pdf
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サイズ | 6.44MB | 詳細 |