Masaki Takeguchi
(Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science)
;
Jonathan Lueke
(Norcada (Canada))
;
Matthew Reynolds
(Norcada (Canada))
;
Baibing Zhao
(KITANO SEIKI Ltd)
;
Ayako Hashimoto
(Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science)
Description:
(abstract)e report the development of a double-tilt LC holder for atomic-resolution LC-ADF-STEM imaging of single-crystal samples under zone-axis incidence conditions. A SrTiO3 <001> lamellar sample, approximately 100 nm thick, was prepared using the focused ion beam technique and transferred onto a silicon nitride window membrane of an LC chip via a glass probe pick-up method in air, which avoids Ga ion beam-induced damage to the window membrane. The sample and pure water were enclosed in an LC and observed under <001> zone-axis incidence conditions using aberration-corrected ADF-STEM. Electron channeling along the atomic columns enabled atomic-resolution LC-ADF-STEM imaging with high contrast, sufficiently overcoming background signals from window membranes and liquids.
Rights:
Keyword: liquid-cell, scanning transmission electron microscopy, zone-axis incidence, atomic resolution
Date published: 2025-07-17
Publisher: Elsevier BV
Journal:
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1016/j.micron.2025.103888
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Updated at: 2025-10-01 12:30:18 +0900
Published on MDR: 2025-10-01 12:19:15 +0900
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