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3384 件のレコードが見つかりました。
Mechanochromism of dynamic disulfide bonds as a chromophoric indicator of adhesion strength for epoxy adhesive
- 論文
- 著者
-
TSAI, Hsing-Ying
;
NAKAMURA, Yasuyuki
;
HU, Wei-Hsun
;
FUJITA, Takehiro
;
NAITO, Masanobu
- キーワード
- Adhesive
- 刊行年月日
- 2021-06-02
- 更新時刻
- 2024-01-05 22:11:20 +0900
Strengthening epoxy adhesives at elevated temperatures based on dynamic disulfide bonds
- 論文
- 著者
-
TSAI, Hsing-Ying
;
NAKAMURA, Yasuyuki
;
FUJITA, Takehiro
;
NAITO, Masanobu
- キーワード
- adhesive
- 刊行年月日
- 2020-11-21
- 更新時刻
- 2022-10-03 01:26:15 +0900
Environmentally friendly recycling system for epoxy resin with dynamic covalent bonding
- 論文
- 著者
-
TSAI, Hsing-Ying
;
FUJITA, Takehiro
;
WANG, Siqian
;
NAITO, Masanobu
- キーワード
- degradation, recycling, glutathione, Epoxy resin, aromatic disulfide bonding
- 刊行年月日
- 2021-12-31
- 更新時刻
- 2024-01-05 22:13:21 +0900
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
- 論文
- 著者
-
Tanuma, Shigeo
;
Powell, C. J.
;
Penn, D. R.
- キーワード
- IMFP, TPP-2M, electron inelastic mean free paths, elemental solids
- 刊行年月日
- 2011-02-08
- 更新時刻
- 2024-01-05 22:14:03 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- 論文
- 著者
-
Tanuma, Shigeo
;
Powell, C. J.
;
Penn, D. R.
- キーワード
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- 刊行年月日
- 2003-02-11
- 更新時刻
- 2022-10-03 01:54:38 +0900
Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-Peak Electron Spectroscopy
- 論文
- 著者
-
Tanuma, Shigeo
;
Shiratori, T
;
Kimura, Takashi
;
Goto, Keisuke
;
Ichimura, Shingo
;
Powell, Cedric J
- キーワード
- Monte Carlo simulation, electron inelastic mean free paths, experimental determination, elastic- peak electron spectroscopy
- 刊行年月日
- 2005-10-31
- 更新時刻
- 2024-01-05 22:13:04 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
- 論文
- 著者
-
OGIWARA, Toshiya
;
TANUMA, Shigeo
- キーワード
- depth resolution function, InP/GaInAsP multilayer specimens, Auger depth profiling analysis, surface roughness, atomic force microscope
- 刊行年月日
- 2011-06-10
- 更新時刻
- 2022-10-03 01:24:02 +0900
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
- 論文
- 著者
-
OGIWARA, Toshiya
;
TANUMA, Shigeo
- キーワード
- argon ion sputtering, InP/GaInAsP multilayer specimens, Auger depth profiling analysis
- 刊行年月日
- 2011-06-10
- 更新時刻
- 2022-10-03 02:01:29 +0900
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting
- 論文
- 著者
-
OGIWARA, Toshiya
;
TANUMA, Shigeo
- キーワード
- peak separation, non-negative least-square curve fit, Auger depth profiling analysis, GaAs/AlAs multilayer
- 刊行年月日
- 2011-06-10
- 更新時刻
- 2022-10-03 01:51:43 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam
- 論文
- 著者
-
OGIWARA, Toshiya
;
HARADA, Tomoko
;
TANUMA, Shigeo
- キーワード
- Auger Depth Profiling Analysis, InP/GaInAsP Multilayer Specimen, Argon Ion Spot Beam
- 刊行年月日
- 2011-06-10
- 更新時刻
- 2022-10-03 02:04:45 +0900