Keyword: ISO
Reset all filters

2 records found.

表面定量分析における標準化の歩み_v3.pdf
電子分光法における表面定量分析の標準化の歩み
Presentation
Creator
田沼 繁夫 SAMURAI ORCID
Keyword
表面定量分析, 国際標準化, ISO, 標準化の歴史, 標準化の意味
Date published
Updated at
2023-06-26 10:42:44 +0900
Summary_of_ISO18118-2.pdf
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Article
Creator
TANUMA, Shigeo SAMURAI ORCID
Keyword
XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900