3 records found.
オージェ電子分光法における背面散乱補正 I．広い分析条件で使用可能な電子の背面散乱補正式の開発
- Journal article
- Creator
-
田沼 繁夫 (author) (Search by this author)
- Keyword
- Auger electron spectroscopy, AES, electron backscattering correction, predictive formula for back scattering correction
- Date published
- 2018-10-19
- Updated at
- 2024-01-05 22:13:01 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- Journal article
- Creator
-
Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author) - Keyword
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- Date published
- 2003-02-11
- Updated at
- 2022-10-03 01:54:38 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
-
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900