5 records found. Displaying records 1 to 5.

1972813_1_art_file_25655210_t3l2d0.pdf
Structural origin of long-range proximity effect in highly disordered fractal MgO/MgB2 nanocomposites: Roles of interface, geometry, and defect
Journal article
Creator
Iku Nakaaki (author) (Search by this author)
;
Aoi Hashimoto (author) (Search by this author)
;
Shun Kondo (author) (Search by this author)
;
Yuichi Ikuhara (author) (Search by this author)
;
Shuuichi Ooi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Minoru Tachiki (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Shunichi Arisawa (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Akiko Nakamura (author) (Search by this author)
National Institute for Materials Science
;
Taku Moronaga (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroyo Segawa (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Takahiro Sakurai (author) (Search by this author)
;
Hitoshi Ohta (author) (Search by this author)
;
Takashi Uchino (author) (Search by this author)
Keyword
nanocomposite, MgO/MgB2, Defects
Date published
2025-10-28
Updated at
2025-12-19 12:01:04 +0900
kikkawa-et-al-2025-observation-of-boron-vacancy-concentration-in-hexagonal-boron-nitride-at-nanometer-scale.pdf
Observation of Boron Vacancy Concentration in Hexagonal Boron Nitride at Nanometer Scale
Journal article
Creator
Jun Kikkawa (author) (Search by this author)
Center for Basic Research on Materials/Advanced Materials Characterization Field/Electron Microscopy Group, National Institute for Materials Science
ORCID SAMURAI ;
Chikara Shinei (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Yuta Masuyama (author) (Search by this author)
National Institutes for Quantum Science and Technology
;
Yuichi Yamazaki (author) (Search by this author)
National Institutes for Quantum Science and Technology
;
Teruyasu Mizoguchi (author) (Search by this author)
Univ. Tokyo, Institute for Industrial Science
;
Koji Kimoto (author) (Search by this author)
Center for Basic Research on Materials, National Institute for Materials Science
ORCID SAMURAI ;
Takashi Taniguchi (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science
ORCID SAMURAI ;
Tokuyuki Teraji (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
hexagonal boronnitride, boron vacancy, electron energy loss spectroscopy, scanning transmission electron microscopy, frist-principles simulation
Date published
2025-09-03
Updated at
2025-09-08 13:41:17 +0900
manuscript_24-0604.docx
Appearance of spectral dip in the cathodoluminescence spectrum of negatively charged nitrogen-vacancy centers in diamonds
Journal article
Creator
Jun Chen (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Chikara Shinei (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Junichi Inoue (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Abe (author) (Search by this author)
;
Takeshi Ohshima (author) (Search by this author)
;
Takashi Sekiguchi (author) (Search by this author)
;
Tokuyuki Teraji (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
Diamond, Spectral dip, NV- centers, Cathodoluminescence
Date published
2024-08-13
Updated at
2024-09-05 16:30:23 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials/Administrative Office, National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (Search by this author)
Fuji Electric Corporation
;
Shinya Takashima (author) (Search by this author)
Fuji Electric Corporation
;
Masaharu Edo (author) (Search by this author)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science
ORCID SAMURAI ;
Takashi Sekiguchi (author) (Search by this author)
University of Tsukuba
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
Date published
2024-08-07
Updated at
2024-08-03 08:30:15 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Ashutosh Kumar (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Wei Yi (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (Search by this author)
;
Shinya Takashima (author) (Search by this author)
;
Masaharu Edo (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Hideki Sakurai (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
;
Takashi Sekiguchi (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
Date published
2022-05-14
Updated at
2024-01-05 22:11:22 +0900
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