Jun Chen
(National Institute for Materials Science)
;
Chikara Shinei
(National Institute for Materials Science)
;
Junichi Inoue
(National Institute for Materials Science)
;
Hiroshi Abe
;
Takeshi Ohshima
;
Takashi Sekiguchi
;
Tokuyuki Teraji
(National Institute for Materials Science)
説明:
(abstract)Negatively charged nitrogen-vacancy (NV-) centers in diamond produce a characteristic optical zero-phonon line (ZPL) at 637 nm. This emission line can be observed under optical excitation (i.e. photoluminescence), but is rarely observed under electron excitation (i.e. cathodoluminescence). This study reports that low-temperature (80 K) and low energy (5 keV) cathodoluminescence spectroscopy is able to detect emission peak or spectral dip at the ZPL of NV- centers. The spectral dip was observed in the diamond samples with high concentration of NV- centers produced by high-energy (2 MeV) e-beam (EB) irradiation. The effects of EB irradiation fluence, NV- centers concentration and substitutional nitrogen concentration on the formation of spectral dip were
discussed, and a model based on the NV- absorption of NV0 emission sideband is proposed.
権利情報:
キーワード: NV- centers , Diamond, Cathodoluminescence, Spectral dip
刊行年月日: 2024-08-13
出版者: Elsevier BV
掲載誌:
研究助成金:
原稿種別: 査読前原稿 (Author's original)
MDR DOI: https://doi.org/10.48505/nims.4726
公開URL: https://doi.org/10.1016/j.diamond.2024.111476
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-09-05 16:30:23 +0900
MDRでの公開時刻: 2024-09-05 16:30:24 +0900
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manuscript_24-0604.docx
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サイズ | 1.48MB | 詳細 |