4 records found.
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
- Journal article
- Creator
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;Shunichi Yoneda (author) (Search by this author)Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Shigeo Tanuma (author) (Search by this author)National Institute for Materials Science
;
;Hiromi Tanaka (author) (Search by this author);Hayaru Shouno (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
- Keyword
- X-ray photoelectron spectroscopy, Survey spectrum, Surrogate model, Total electron attenuation length, Thickness estimation
- Date published
- 2026-03-31
- Updated at
- 2026-04-16 15:42:06 +0900
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
- Journal article
- Creator
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Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Taisuke T. Sasaki (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Yoshitaka Matsushita (author) (Search by this author)National Institute for Materials Science
;
Keitaro Sodeyama (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
- Keyword
- Materials informatics, Spectral decomposition, Bayesian estimation, Feature selection, AI-ready
- Date published
- 2024-12-31
- Updated at
- 2025-11-10 16:30:53 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- Journal article
- Creator
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;Atsushi Machida (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
;Hayaru Shouno (author) (Search by this author)Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Masato Okada (author) (Search by this author)
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2024-05-29
- Updated at
- 2025-11-10 12:30:27 +0900
Rapid, comprehensive search of crystalline phases from X-ray diffraction in seconds via GPU-accelerated Bayesian variational inference
- Journal article
- Creator
-
Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Yoshitaka Matsushita (author) (Search by this author)National Institute for Materials Science
;
Masahiko Demura (author) (Search by this author)National Institute for Materials Science
- Keyword
- X-ray diffraction, GPU computing, sparse modeling, bayesian inference, model selection
- Date published
- 2025-12-31
- Updated at
- 2025-07-26 08:30:18 +0900