5 records found.
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- Journal article
- Creator
-
Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author) - Keyword
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- Date published
- 2003-02-11
- Updated at
- 2022-10-03 01:54:38 +0900
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
- Journal article
- Creator
-
Prabhat Kumar (author) (Search by this author)
https://orcid.org/0000-0003-3897-193X
(unauthenticated)
;
Shunsuke Tsuda (author) (Search by this author)
;
Koichiro Yaji (author) (Search by this author)
;
Shinji Isogami (author) (Search by this author)
- Keyword
- MXene, Interface, XPS
- Date published
- 2025-12-31
- Updated at
- 2025-09-16 12:30:22 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- Journal article
- Creator
-
J. W. Liu (author) (Search by this author)National Institute for Materials Science
;
T. Teraji (author) (Search by this author)National Institute for Materials Science
;
B. Da (author) (Search by this author)National Institute for Materials Science
;
Y. Koide (author) (Search by this author)National Institute for Materials Science
- Keyword
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- Date published
- 2024-09-02
- Updated at
- 2024-09-13 12:30:32 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
-
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900
実験室型 XPS 装置による溶液種の観察と全固体電池の実働環境計測
- Journal article
- Creator
-
;遠藤 頼夢 (author) (Search by this author)National Institute for Materials Science増田 卓也 (author) (Search by this author)National Institute for Materials Science
- Keyword
- オペランド, in situ, XPS
- Date published
- 2023-08-07
- Updated at
- 2024-12-02 16:30:52 +0900