Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
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TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900
Crystallographic and Electronic Structures of Nb:YTaO4 and Tb:YTaO4 Single-Crystal Scintillators
- Journal article
- Creator
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Yueshen Zhou (author) (Search by this author)
;
;Encarnación G. Víllora (author) (Search by this author)Ryoji Sahara (author) (Search by this author)
;
Arkapol Saengdeejing (author) (Search by this author)
;
Kiyoshi Shimamura (author) (Search by this author)
- Keyword
- Single-crystal structure analysis, DFT, Tb:YTaO4, XPS, Nb:YTaO4
- Date published
- 2025-07-31
- Updated at
- 2025-08-01 10:06:22 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- Journal article
- Creator
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J. W. Liu (author) (Search by this author)National Institute for Materials Science
;
T. Teraji (author) (Search by this author)National Institute for Materials Science
;
B. Da (author) (Search by this author)National Institute for Materials Science
;
Y. Koide (author) (Search by this author)National Institute for Materials Science
- Keyword
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- Date published
- 2024-09-02
- Updated at
- 2024-09-13 12:30:32 +0900