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Article and Dataset
Collection
Resource type
Journal article(3)
Keyword
interfacial analysis (1)
2D materials (1)
2D transist (1)
Atomically thin (1)
Coulomb scattering strength (1)
InSe (1)
MoS2 transistors (1)
dark excitons (1)
edge contacts (1)
electron scattering (1)
(more)
License
Creative Commons BY Attribution 4.0 International (2)
In Copyright (1)
File type
application/pdf (3)
3 records found.
Monolayer indium selenide: an indirect bandgap material exhibits efficient brightening of dark excitons
Journal article
Creator
Naomi Tabudlong Paylaga
(author) (
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)
Naomi Tabudlong Paylaga
;
Chang-Ti Chou
(author) (
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)
Chang-Ti Chou
;
Chia-Chun Lin
(author) (
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)
Chia-Chun Lin
;
Takashi Taniguchi
(author) (
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)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
Kenji Watanabe
(author) (
Search by this author
)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Raman Sankar
(author) (
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)
Raman Sankar
;
Yang-hao Chan
(author) (
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)
Yang-hao Chan
;
Shao-Yu Chen
(author) (
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)
Shao-Yu Chen
;
Wei-Hua Wang
(author) (
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)
Wei-Hua Wang
Keyword
Atomically thin
,
InSe
,
dark excitons
Date published
2024-02-20
Updated at
2025-02-28 08:30:58 +0900
Interfacial Elemental Analysis of Slanted Edge-Contacted Monolayer MoS
2
Transistors via Directionally Angled Etching
Journal article
Creator
Chia-Chun Lin
(author) (
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)
Chia-Chun Lin
;
Naomi Tabudlong Paylaga
(author) (
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)
Naomi Tabudlong Paylaga
;
Chun-Chieh Yen
(author) (
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)
Chun-Chieh Yen
;
Yu-Hsuan Lin
(author) (
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)
Yu-Hsuan Lin
;
Kuang-Hsu Wang
(author) (
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)
Kuang-Hsu Wang
;
Kenji Watanabe
(author) (
Search by this author
)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Takashi Taniguchi
(author) (
Search by this author
)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
Chi-Te Liang
(author) (
Search by this author
)
Chi-Te Liang
;
Shao-Yu Chen
(author) (
Search by this author
)
Shao-Yu Chen
;
Wei-Hua Wang
(author) (
Search by this author
)
Wei-Hua Wang
Keyword
edge contacts
,
MoS2 transistors
,
interfacial analysis
Date published
2025-02-04
Updated at
2026-03-10 12:30:24 +0900
Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors
Journal article
Creator
Yi-Te Lee
(author) (
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)
Yi-Te Lee
;
Yu-Ting Huang
(author) (
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)
Yu-Ting Huang
;
Shao-Pin Chiu
(author) (
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)
Shao-Pin Chiu
;
Ruey-Tay Wang
(author) (
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)
Ruey-Tay Wang
;
Takashi Taniguchi
(author) (
Search by this author
)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
Kenji Watanabe
(author) (
Search by this author
)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Raman Sankar
(author) (
Search by this author
)
Raman Sankar
;
Chi-Te Liang
(author) (
Search by this author
)
Chi-Te Liang
;
Wei-Hua Wang
(author) (
Search by this author
)
Wei-Hua Wang
;
Sheng-Shiuan Yeh
(author) (
Search by this author
)
Sheng-Shiuan Yeh
;
Juhn-Jong Lin
(author) (
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)
Juhn-Jong Lin
Keyword
electron scattering
,
2D materials
,
Coulomb scattering strength
,
low-frequency noise
,
indium selenide
,
interfacial Coulomb scatterers
,
2D transist
Date published
2024-01-10
Updated at
2025-10-21 15:50:45 +0900
Keyword
interfacial analysis
(1)
2D materials
(1)
2D transist
(1)
Atomically thin
(1)
Coulomb scattering strength
(1)
InSe
(1)
MoS2 transistors
(1)
dark excitons
(1)
edge contacts
(1)
electron scattering
(1)
indium selenide
(1)
interfacial Coulomb scatterers
(1)
low-frequency noise
(1)
RDE metadata def
RDE invoice schema
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