論文 Interfacial Elemental Analysis of Slanted Edge-Contacted Monolayer MoS2 Transistors via Directionally Angled Etching

Chia-Chun Lin ; Naomi Tabudlong Paylaga ; Chun-Chieh Yen ; Yu-Hsuan Lin ; Kuang-Hsu Wang ; Kenji Watanabe SAMURAI ORCID (National Institute for Materials Science) ; Takashi Taniguchi SAMURAI ORCID (National Institute for Materials Science) ; Chi-Te Liang ; Shao-Yu Chen ; Wei-Hua Wang

コレクション

引用
Chia-Chun Lin, Naomi Tabudlong Paylaga, Chun-Chieh Yen, Yu-Hsuan Lin, Kuang-Hsu Wang, Kenji Watanabe, Takashi Taniguchi, Chi-Te Liang, Shao-Yu Chen, Wei-Hua Wang. Interfacial Elemental Analysis of Slanted Edge-Contacted Monolayer MoS2 Transistors via Directionally Angled Etching. ACS Nano. 2025, 19 (4), 4452-4461. https://doi.org/10.1021/acsnano.4c13581

説明:

(abstract)

Edge contacts offer a significant advantage for enhancing the performance of semiconducting transition metal dichalcogenide (TMDC) devices by interfacing with the metallic contacts on the lateral side, which allows encapsulation of all of the channel material. However, despite intense research, the fabrication of feasible electrical edge contacts to TMDCs to improve device performance remains a great challenge, as interfacial chemical characterization via conventional methods is lacking. A major bottleneck in explicitly understanding the chemical and electronic properties of the edge contact at the metal–two-dimensional (2D) semiconductor interface is the small cross section when characterizing nominally one-dimensional edge contacts. Here, we demonstrate a directional angled etching technique that enables characterization of the interfacial chemistry at the metal–MoS2 junction when in an edge-contact configuration. The slanted edge structure provides a substantial cross section for elemental analysis of the edge contact by conventional X-ray photoemission spectroscopy in which a simple chemical environment and sharp interface were revealed. Facilitated by the well-characterized contact interface, we realized slanted edge-contacted monolayer MoS2 transistors encapsulated by hexagonal boron nitride. The transport characteristics and photoluminescence of these transistors allowed us to attribute the efficient carrier injection to direct and Fowler–Nordheim tunneling, validating the distinct Au–MoS2 interface. The established method represents a viable approach to fabricate edge contacts with encapsulated 2D material devices, which is crucial for both the fundamental study of 2D materials and high-performance electronic applications.

権利情報:

キーワード: edge contacts
, MoS2 transistors
, interfacial analysis

刊行年月日: 2025-02-04

出版者: American Chemical Society (ACS)

掲載誌:

  • ACS Nano (ISSN: 1936086X) vol. 19 issue. 4 p. 4452-4461

研究助成金:

  • Ministry of Education, Culture, Sports, Science and Technology
  • Japan Society for the Promotion of Science 20H00354
  • Japan Society for the Promotion of Science 21H05233
  • Japan Society for the Promotion of Science 23H02052
  • National Science and Technology Council 112-2740-M-002-006
  • National Science and Technology Council 113-2740-M-002-007
  • National Science and Technology Council ESCA003500

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1021/acsnano.4c13581

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更新時刻: 2026-03-09 09:58:18 +0900

MDRでの公開時刻: 2026-03-10 09:03:20 +0900

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