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ジャーナル論文(4)
キーワード
gallium nitride (4)
atom probe tomography (2)
cathodoluminescence (1)
positron (1)
transmission electron microscopy (1)
vacancy (1)
(more)
ライセンス
In Copyright (4)
ファイル種別
application/pdf (4)
ライセンス: In Copyright
資源タイプ: ジャーナル論文
キーワード: gallium nitride
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4 件のレコードが見つかりました。
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
ジャーナル論文
著者
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kensuke Sumida
(author) (
この著者で検索
)
Kensuke Sumida
;
Tetsuo Narita
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
Tetsuo Narita
;
Masahiro Horita
(author) (
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)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
Masahiro Horita
;
Junya Sahashi
(author) (
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)
Junya Sahashi
;
Shun Lu
(author) (
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)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
Shun Lu
;
Jun Suda
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
Jun Suda
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
刊行年月日
2026-06-22
更新時刻
2026-06-25 09:46:49 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ryo Tanaka
(author) (
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)
Fuji Electric Corporation
Ryo Tanaka
;
Shinya Takashima
(author) (
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)
Fuji Electric Corporation
Shinya Takashima
;
Masaharu Edo
(author) (
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)
Fuji Electric Corporation
Masaharu Edo
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Takashi Sekiguchi
(author) (
この著者で検索
)
University of Tsukuba
Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Ryo Tanaka
(author) (
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)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
Ryo Tanaka
;
Shinya Takashima
(author) (
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)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
Shinya Takashima
;
Katsunori Ueno
(author) (
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)
Katsunori Ueno
;
Masaharu Edo
(author) (
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)
Masaharu Edo
;
Kohei Shima
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
Michal Bockowski
キーワード
gallium nitride
刊行年月日
2024-02-29
更新時刻
2025-03-01 12:30:45 +0900
Annealing properties of vacancy-type defects in ion implanted GaN during ultra-high-pressure annealing studied by using a monoenergetic positron beam
ジャーナル論文
著者
Akira Uedono
(author) (
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)
Akira Uedono
;
Hideki Sakurai
(author) (
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)
Hideki Sakurai
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
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)
Kacper Sierakowski
;
Shoji Ishibashi
(author) (
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)
Shoji Ishibashi
;
Shigefusa F. Chichibu
(author) (
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)
Shigefusa F. Chichibu
;
Michal Bockowski
(author) (
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)
Michal Bockowski
;
Jun Suda
(author) (
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)
Jun Suda
;
Tadakatsu Ohokubo
(author) (
この著者で検索
)
Tadakatsu Ohokubo
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
Nobuyuki Ikarashi
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
キーワード
gallium nitride
,
vacancy
,
positron
刊行年月日
2023-03-15
更新時刻
2024-01-05 22:12:35 +0900
キーワード
gallium nitride
(4)
atom probe tomography
(2)
cathodoluminescence
(1)
positron
(1)
transmission electron microscopy
(1)
vacancy
(1)
RDEメタデータ定義
RDE送り状
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