Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- ジャーナル論文
- 著者
-
Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
;
Jun Chen (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
;
;Ryo Tanaka (author) (この著者で検索)Fuji Electric Corporation;Shinya Takashima (author) (この著者で検索)Fuji Electric Corporation;Masaharu Edo (author) (この著者で検索)Fuji Electric CorporationTadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
;
Takashi Sekiguchi (author) (この著者で検索)University of Tsukuba - キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- 刊行年月日
- 2024-08-07
- 更新時刻
- 2024-08-03 08:30:15 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- ジャーナル論文
- 著者
-
;Yudai Yamaguchi (author) (この著者で検索);Yuta Inaba (author) (この著者で検索);Ryoji Arai (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索);Michinori Shiomi (author) (この著者で検索);Daiji Kasahara (author) (この著者で検索);Mikihiro Yokozeki (author) (この著者で検索);Noriyuki Fuutagawa (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Kouichi Akahane (author) (この著者で検索);Naokatsu Yamamoto (author) (この著者で検索)Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- quantum dot, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-11
- 更新時刻
- 2025-04-14 16:30:23 +0900