4 records found.
全固体リチウムイオン電池配置でのSi負極のオペランド反応解析
- Journal article
- Creator
-
増田 卓也 (author) (Search by this author)National Institute for Materials Science
- Keyword
- オペランド, in situ, XPS, AFM
- Date published
- Updated at
- 2024-12-06 17:17:59 +0900
実験室型 XPS 装置による溶液種の観察と全固体電池の実働環境計測
- Journal article
- Creator
-
;遠藤 頼夢 (author) (Search by this author)National Institute for Materials Science増田 卓也 (author) (Search by this author)National Institute for Materials Science
- Keyword
- オペランド, in situ, XPS
- Date published
- 2023-08-07
- Updated at
- 2024-12-02 16:30:52 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- Journal article
- Creator
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J. W. Liu (author) (Search by this author)National Institute for Materials Science
;
T. Teraji (author) (Search by this author)National Institute for Materials Science
;
B. Da (author) (Search by this author)National Institute for Materials Science
;
Y. Koide (author) (Search by this author)National Institute for Materials Science
- Keyword
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- Date published
- 2024-09-02
- Updated at
- 2024-09-13 12:30:32 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
-
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900