4 records found.
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- Article
- Creator
-
J. W. Liu
;
T. Teraji
;
B. Da
;
Y. Koide
- Keyword
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- Date published
- 2024-09-02
- Updated at
- 2024-09-13 12:30:32 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Article
- Creator
-
TANUMA, Shigeo
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900