ライセンス: Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International キーワード: X-ray photoelectron spectroscopy
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1-s2.0-S0368204826000216-main.pdf
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
ジャーナル論文
著者
Shunichi Yoneda (author) (この著者で検索)
;
Ryo Murakami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shigeo Tanuma (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiromi Tanaka (author) (この著者で検索)
;
Hayaru Shouno (author) (この著者で検索)
;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
X-ray photoelectron spectroscopy, Survey spectrum, Surrogate model, Total electron attenuation length, Thickness estimation
刊行年月日
2026-03-31
更新時刻
2026-04-16 15:42:06 +0900
Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shuichi Ogawa (author) (この著者で検索)
;
Akitaka Yoshigoe (author) (この著者で検索)
キーワード
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
刊行年月日
2024-12-03
更新時刻
2025-01-21 12:30:34 +0900
Shinotsuka2023_JES267_147370.pdf
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Malinda Siriwardana (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Hayaru Shouno (author) (この著者で検索)
The University of Electro-Communications Graduate School of Informatics and Engineering
ORCID ;
Masato Okada (author) (この著者で検索)
The University of Tokyo Graduate School of Frontier Science
ORCID
キーワード
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
刊行年月日
2023-07-06
更新時刻
2024-01-05 22:11:57 +0900
Murakami_JES245_147003_2020_Preprint_20200210.pdf
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ;
Murakami, Ryo (author) (この著者で検索)
;
Tanaka, Hiromi (author) (この著者で検索)
;
Shouno, Hayaru (author) (この著者で検索)
; ORCID SAMURAI
キーワード
Automatic spectrum analysis, Bayesian information criterion, Multiple core level spectra, X-ray photoelectron spectroscopy
刊行年月日
2020-10-03
更新時刻
2024-01-05 22:13:27 +0900