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3 件のレコードが見つかりました。 1件目から3件目まで表示します。

2025JJAP_Ogawa_SI.pdf
Effects of interface formation process on electronic properties of n-type Ti0.3Zn0.7O1.3/p-type Si stack structure
ジャーナル論文
著者
Kenta Ogawa (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Nano Electronics Device Materials Group
;
Toyohiro Chikyow (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/LSTC Materials Research Lab
ORCID SAMURAI ;
Yuki Daimon (author) (この著者で検索)
Meiji University
;
Atsushi Ogura (author) (この著者で検索)
Meiji University
;
Takahiro Nagata (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Nano Electronics Device Materials Group
ORCID SAMURAI
キーワード
oxide semiconductor, tunnel field effect transistor, combinatorial method, interface
刊行年月日
2025-05-19
更新時刻
2026-02-14 20:23:13 +0900

2023A01879A.pdf
NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy
ジャーナル論文
著者
Asahiko Matsuda (author) (この著者で検索)
ORCID SAMURAI ;
Takashi Teramoto (author) (この著者で検索)
ORCID ;
Takahiro Nagata (author) (この著者で検索)
ORCID SAMURAI ;
Dominic Gerlach (author) (この著者で検索)
ORCID ;
Peng Shen (author) (この著者で検索)
ORCID ;
Shigenori Ueda (author) (この著者で検索)
ORCID SAMURAI ;
Takako Kimura (author) (この著者で検索)
;
Christian Dussarrat (author) (この著者で検索)
; ORCID SAMURAI
キーワード
Fluorination, Surface passivation, hard X-ray photoelectron spectroscopy, Gallium nitride
刊行年月日
2024-03-19
更新時刻
2026-03-19 14:27:24 +0900

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