ファイル種別: application/zip 資源タイプ: データセット
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14 件のレコードが見つかりました。 1件目から10件目まで表示します。

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Dataset
PoLyInfo Conceptual Schema Version 1.0
データセット
コレクション
PoLyInfo Knowledge Collection
著者
Masashi Ishii (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Koichi Sakamoto (author) (この著者で検索)
National Institute for Materials Science
キーワード
Polymer chemistry knowledge, PoLyInfo, Conceptual schema, ShEx, collection - PoLyInfo Knowledge
刊行年月日
更新時刻
2024-03-27 12:30:25 +0900
Dataset
Examples of SQS (special quasirandom structure) models for arbitrary binary bcc (body centered cubic) and hcp (hexagonal close packed) structures
データセット
著者
ORCID SAMURAI
キーワード
Sommerfeld model, quasi-harmonic vibrational contribution, First-principles calculation, Debye model, titanium alloys
刊行年月日
2020-10-15
更新時刻
2024-01-05 22:12:16 +0900
Dataset
SuperCon RDF Ver.1.2
データセット
コレクション
SuperCon Knowledge Collection
著者
Masashi Ishii (editor) (この著者で検索)
National Institute for Materials Science
キーワード
SuperCon, Superconductors, RDF, Ontology, Semantic Web, SPARQL
刊行年月日
更新時刻
2024-08-29 20:03:44 +0900
データセット
Orthogonal spectroscopic assessment of higher-order structure of nucleic acids and its concentration-dependent polymorphism
データセット
著者
Taiji Oyama (author) (この著者で検索)
JASCO Corporation
;
Satoko Suzuki (author) (この著者で検索)
JASCO Corporation
;
Ken-ichi Akaoa (author) (この著者で検索)
JASCO Corporation
;
Kazunori Ikebukurob (author) (この著者で検索)
Tokyo University of Agriculture and Technology
;
Kohsaku Kawakami (author) (この著者で検索)
National Institute for Materials Science External Collaboration Division/Materials Open Platform for Pharmaceutical Science
ORCID SAMURAI ;
Tomohiko Yamazaki (author) (この著者で検索)
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Medical Soft Matter Group
ORCID SAMURAI
キーワード
Circular Dichroism spectrum, Raman spectrum, Fourier Transform Infrared spectrum, Fluorescence spctrum, Atomic Force Microscope
刊行年月日
更新時刻
2026-08-27 15:52:20 +0900
Dataset
Electrodeposited copper film data
データセット
著者
Ryo Tamura (author) (この著者で検索)
National Institute for Materials Science
;
Ryuichi Inaba (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Mami Watanabe (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Yutaro Mori (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Makoto Urushihara (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Kenji Yamaguchi (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Shoichi Matsuda (author) (この著者で検索)
National Institute for Materials Science
キーワード
Electrodeposition, copper film
刊行年月日
更新時刻
2024-10-30 16:30:48 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
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