Laser ablation process of CsPbBr3 heterostructures for light-emitting diode applications
- ジャーナル論文
- 著者
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;Ryunosuke Kumagai (author) (この著者で検索)Nihon University a College of Engineering, Department of Electrical and Electronic Engineering;Ren Koguchi (author) (この著者で検索);Takuro Dazai (author) (この著者で検索);Toshihiro Sato (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索);Ryuzi Katoh (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Halide perovskite, pulsed laser deposition, time resolved microwave conductivity, time resolved photoluminescence, light emitting diode
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-09-10 16:30:32 +0900
Fluorinated Glycidyl Triazolyl Polymers Exhibiting Thermally Stable Layered Structures and Sticky Hydrophobic Surfaces
- ジャーナル論文
- 著者
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Taichi Ikeda (author) (この著者で検索)
;
Masafumi Yoshio (author) (この著者で検索)
- キーワード
- Fluorinated polymers, Liquid-crystal polymers, Post-polymerization functionalization, Click chemistry, Contact angle hysteresis, Sticky hydrophobic surface
- 刊行年月日
- 2026-02-27
- 更新時刻
- 2026-03-13 08:30:08 +0900
Thermoelectric, magnetotransport, and ultrafast dynamics of bismuth telluride thin films grown using pulsed laser deposition: Effects of substrate temperature and post-annealing
- ジャーナル論文
- 著者
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;Le Thi Cam Tuyen (author) (この著者で検索)Chang Gung University a Division of Natural Science, Center for Education;Bih-Show Lou (author) (この著者で検索);Jyh-Wei Lee (author) (この著者で検索);Ngo Ngoc Uyen (author) (この著者で検索);Phuoc Huu Le (author) (この著者で検索);Chien-Neng Liao (author) (この著者で検索);Chih-Wei Luo (author) (この著者で検索)Jiunn-Yuan Lin (author) (この著者で検索)
- キーワード
- Bi2Te3, pulsed laser deposition, thermoelectrics, magnetotransport, pump-probe
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-03-24 13:08:14 +0900
SuperCon RDF Ver.1.2
- データセット
- コレクション
- SuperCon Knowledge Collection
- 著者
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Masashi Ishii (editor) (この著者で検索)National Institute for Materials Science
- キーワード
- SuperCon, Superconductors, RDF, Ontology, Semantic Web, SPARQL
- 刊行年月日
- 更新時刻
- 2024-08-29 20:03:44 +0900
Electron doping of exfoliated multilayer graphene induced by dissociative H2 adsorption due to long-term exposure to 80-bar H2 gas
- ジャーナル論文
- 著者
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;Hyun-Seok Jang (author) (この著者で検索)Incheon National University a Department of Physics;Younghun Kim (author) (この著者で検索);Heewoo Lee (author) (この著者で検索);Soo Bong Choi (author) (この著者で検索);Jeongwoo Kim (author) (この著者で検索)Byung Hoon Kim (author) (この著者で検索)
- キーワード
- Multilayer graphene, high H2 pressure, dissociative H2 adsorption, hydrogen electron-doped graphene
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-02-10 12:30:21 +0900
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
- ジャーナル論文
- 著者
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;Nao Suzuki (author) (この著者で検索)University of Tsukuba a Institute of Pure and Applied Sciences;Ziwei Hu (author) (この著者で検索);Sota Nakayama (author) (この著者で検索);Soh Kushida (author) (この著者で検索);Yohei Yamamoto (author) (この著者で検索);Wijak Yospanya (author) (この著者で検索);Reiko Oda (author) (この著者で検索);Takaki Kanbara (author) (この著者で検索)Junpei Kuwabara (author) (この著者で検索)
- キーワード
- Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
- 刊行年月日
- 2026-06-02
- 更新時刻
- 2026-06-19 13:05:19 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900