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112 件のレコードが見つかりました。 101件目から110件目まで表示します。

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GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
Dataset
Electrodeposited copper film data
データセット
著者
Ryo Tamura (author) (この著者で検索)
National Institute for Materials Science
;
Ryuichi Inaba (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Mami Watanabe (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Yutaro Mori (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Makoto Urushihara (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Kenji Yamaguchi (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Shoichi Matsuda (author) (この著者で検索)
National Institute for Materials Science
キーワード
Electrodeposition, copper film
刊行年月日
更新時刻
2024-10-30 16:30:48 +0900
Multi-objective optimization for designing structurally similar proteins with dissimilar sequences.pdf
Multi-objective optimization for designing structurally similar proteins with dissimilar sequences
ジャーナル論文
著者
Ryo Akiba (author) (この著者で検索)
Institute of Science Tokyo a School of Life Science and Technology
;
Yoshitaka Moriwaki (author) (この著者で検索)
;
Ryuichiro Ishitani (author) (この著者で検索)
;
Naruki Yoshikawa (author) (この著者で検索)
キーワード
Protein design, multi-objective optimization, generative AI
刊行年月日
2026-12-31
更新時刻
2026-02-03 15:05:41 +0900
Catalyst poisoning influences from various functional groups of energy carriers towards electrochemical oxidation reactions on non-noble high-entropy .pdf
Catalyst poisoning influences from various functional groups of energy carriers towards electrochemical oxidation reactions on non-noble high entropy alloy anodes in acidic media
ジャーナル論文
著者
Rafat Tahawy (author) (この著者で検索)
University of Tsukuba a Department of Applied Physics, Institute of Pure and Applied Sciences
;
Salma Aridha Muflihah (author) (この著者で検索)
;
Kosuke Hara (author) (この著者で検索)
;
Tatsuhiko Ohto (author) (この著者で検索)
;
Hisanori Tanimoto (author) (この著者で検索)
;
Tianshu Li (author) (この著者で検索)
;
Mahmoud Abdelnabi (author) (この著者で検索)
;
Samuel Jeong (author) (この著者で検索)
;
Tomohiko Nishiuchi (author) (この著者で検索)
;
Hajime Kimizuka (author) (この著者で検索)
;
Akfiny Hasdi Aimon (author) (この著者で検索)
;
Yoshikazu Ito (author) (この著者で検索)
キーワード
Non-noble metal, high entropy alloy, oxygen evolution reaction, oxidation reaction, anode, catalyst poisoning
刊行年月日
2026-04-24
更新時刻
2026-04-27 13:14:06 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
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