Non-negative matrix factorization analysis of spatially-resolved photoemission spectra for epitaxially grown graphene on SiC
- Journal article
- Creator
-
;Masaki Imamura (author) (Search by this author)Synchrotron Light Application Center, Saga UniversityKazutoshi Takahashi (author) (Search by this author)
- Keyword
- Photoemission spectroscopy, non-negative matrix factorization, graphene, machine learning, data-driven analysis
- Date published
- 2026-06-19
- Updated at
- 2026-06-24 15:38:41 +0900
Microscopic observations of RGB circularly polarized luminescence from solid microspheres with liquid crystalline molecular order
- Journal article
- Creator
-
;Kun Li (author) (Search by this author)a Department of Materials Science, Institute of Pure and Applied Sciences, and Tsukuba Research Center for Energy Materials Science (TREMS), University of Tsukuba;Chunya Fu (author) (Search by this author);Hiroshi Yamagishi (author) (Search by this author);Sota Nakayama (author) (Search by this author);Wey Yih Heah (author) (Search by this author);Yixiang Cheng (author) (Search by this author);Reiko Oda (author) (Search by this author);Wijak Yospanya (author) (Search by this author)Yohei Yamamoto (author) (Search by this author)
- Keyword
- Liquid crystal, circularly polarized luminescence, microspheres
- Date published
- 2025-12-31
- Updated at
- 2025-07-16 16:14:56 +0900
Motion of Two-Dimensional Excitons in Momentum Space Leads to Pseudospin Distribution Narrowing on the Bloch Sphere
- Journal article
- Creator
-
;Garima Gupta (author) (Search by this author)Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
Kausik Majumdar (author) (Search by this author) - Keyword
- 2D materials, Exciton Pseudospin, Valley Decoherence, Motional Narrowing, Polarization Contrast, MoS2
- Date published
- 2024-05-08
- Updated at
- 2025-07-29 12:30:27 +0900
Precipitative Coating of Calcium Phosphate on Microporous Silica–Titania Hybrid Particles in Simulated Body Fluid
- Journal article
- Creator
-
;Reo Kimura (author) (Search by this author)Nagaoka University of TechnologyKota Shiba (author) (Search by this author)Research Center for Macromolecules and Biomaterials/Biomaterials Field/Olfactory Sensors Group, National Institute for Materials Science
;
;Kanata Fujiwara (author) (Search by this author)Nagaoka University of Technology;Yanni Zhou (author) (Search by this author)Nagaoka University of Technology;Iori Yamada (author) (Search by this author)Nagaoka University of TechnologyMotohiro Tagaya (author) (Search by this author)Nagaoka University of Technology
- Keyword
- bioceramic nanoparticles, simulated body fluid, nanopore, CP precipitative coating, silica–titania nanohybrid
- Date published
- 2023-05-28
- Updated at
- 2024-11-20 18:40:02 +0900
Distinct macrophage uptake of engineered and biological particles driven by host age and sex
- Journal article
- Creator
-
;Riki Toita (author) (Search by this author)a Molecular Biosystems Research Institute, National Institute of Advanced Industrial Science and Technology (AIST);Yuki Shimizu (author) (Search by this author)Jeong-Hun Kang (author) (Search by this author)
- Keyword
- Word, nanomedicines, aging, biological sex, macrophages, uptake, RNA-seq
- Date published
- 2026-12-31
- Updated at
- 2026-02-03 15:03:39 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-03-30 18:50:38 +0900