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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- 論文
- 著者
-
TANUMA, Shigeo
- キーワード
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- 刊行年月日
- 2005-12-28
- 更新時刻
- 2024-01-05 22:11:34 +0900