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論文・データセット
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データセット(14)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Gaussian09 (1)
Li-ion battery (1)
Lipid droplets (1)
RDE (1)
Research Data Express (1)
battery (1)
compound semiconductor (1)
(more)
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In Copyright (8)
Creative Commons BY Attribution 4.0 International (2)
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application/pdf (14)
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ファイル種別: application/pdf
資源タイプ: データセット
全ての絞り込みを解除
14 件のレコードが見つかりました。
全ての絞り込みを解除
Designing a Unified Data Structure for Solid-Electrolyte Research Projects
データセット
著者
Yasuhiro Fujiwara
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1005-6131
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
NIMS Researchers Directory SAMURAI
Yasuhiro Fujiwara
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
;
Kazunori Takada
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7568-1806
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Solid-State Battery Group
NIMS Researchers Directory SAMURAI
Kazunori Takada
;
Kota Suzuki
(author) (
この著者で検索
)
Institute of Science Tokyo
Kota Suzuki
;
Satoshi Hori
(author) (
この著者で検索
)
Institute of Science Tokyo
Satoshi Hori
;
Masaki Azuma
(author) (
この著者で検索
)
Institute of Science Tokyo
Masaki Azuma
;
Ryoji Kanno
(author) (
この著者で検索
)
Institute of Science Tokyo
Ryoji Kanno
;
Yoshiyuki Inaguma
(author) (
この著者で検索
)
Gakushuin University
Yoshiyuki Inaguma
;
Akitoshi Hayashi
(author) (
この著者で検索
)
Osaka Metropolitan University
Akitoshi Hayashi
;
Yasutoshi Iriyama
(author) (
この著者で検索
)
Graduate School of Engineering, Nagoya University
Yasutoshi Iriyama
;
Hirotoshi Yamada
(author) (
この著者で検索
)
Nagasaki University
Hirotoshi Yamada
;
Tetsuhiro Katsumata
(author) (
この著者で検索
)
Tokai University
Tetsuhiro Katsumata
キーワード
process chain
,
data structure
,
data model
,
data management
,
Research Data Express
,
RDE
,
solid electrolytes
刊行年月日
2025-12-31
更新時刻
2025-12-19 08:30:30 +0900
Liquid electrolyte informatics using an exhaustive search with linear regression
データセット
著者
SODEYAMA, Keitaro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9228-0729
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SODEYAMA, Keitaro
;
IGARASHI, Yasuhiko
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1042-6657
(unauthenticated)
IGARASHI, Yasuhiko
;
NAKAYAMA, Tomofumi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1240-3571
(unauthenticated)
NAKAYAMA, Tomofumi
;
TATEYAMA, Yoshitaka
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5532-6134
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
TATEYAMA, Yoshitaka
;
OKADA, Masato
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
OKADA, Masato
キーワード
molecules
,
Li-ion battery
,
quantum chemistry calculations
,
materials informatics
,
Gaussian09
,
organic solvents
刊行年月日
2018-06-14
更新時刻
2024-02-08 17:54:30 +0900
Quantifying the Thresholds of the Phospholipid Surface Density for Nonspecific Protein Adsorption and Desorption at the Triacylglycerol/Water Interface
データセット
著者
Chiho Kataoka-Hamai
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4068-0405
NIMS Researchers Directory SAMURAI
Chiho Kataoka-Hamai
キーワード
Lipid droplets
,
triacylglycerol
,
oil/water interface
,
protein
刊行年月日
2025-09-23
更新時刻
2025-09-24 16:30:26 +0900
Machine learning prediction of coordination energies for alkali group elements in battery electrolyte solvents
データセット
著者
ISHIKAWA, Atsushi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6908-831X
NIMS Researchers Directory SAMURAI
ISHIKAWA, Atsushi
;
SODEYAMA, Keitaro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9228-0729
NIMS Researchers Directory SAMURAI
SODEYAMA, Keitaro
;
IGARASHI, Yasuhiko
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1042-6657
(unauthenticated)
IGARASHI, Yasuhiko
;
NAKAYAMA, Tomofumi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1240-3571
(unauthenticated)
NAKAYAMA, Tomofumi
;
TATEYAMA, Yoshitaka
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5532-6134
NIMS Researchers Directory SAMURAI
TATEYAMA, Yoshitaka
;
OKADA, Masato
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
OKADA, Masato
キーワード
quantum chemistry
,
electrolyte
,
battery
刊行年月日
2019-11-18
更新時刻
2024-01-05 22:13:39 +0900
First-principles calculations of optical constants
データセット
著者
SHINOTSUKA, Hiroshi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
SHINOTSUKA, Hiroshi
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
;
TANUMA, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
キーワード
first-principles calculation
,
energy loss function
,
optical constant
,
compound semiconductor
刊行年月日
2021-07-06
更新時刻
2022-10-03 02:03:24 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
Gaussian09
(1)
Li-ion battery
(1)
Lipid droplets
(1)
RDE
(1)
Research Data Express
(1)
battery
(1)
compound semiconductor
(1)
data management
(1)
data model
(1)
data structure
(1)
electrolyte
(1)
energy loss function
(1)
first-principles calculation
(1)
materials informatics
(1)
molecules
(1)
oil/water interface
(1)
optical constant
(1)
organic solvents
(1)
process chain
(1)
protein
(1)
quantum chemistry
(1)
quantum chemistry calculations
(1)
solid electrolytes
(1)
triacylglycerol
(1)
RDEメタデータ定義
RDE送り状
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コレクション
資源タイプ
データセット(14)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Gaussian09 (1)
Li-ion battery (1)
Lipid droplets (1)
RDE (1)
Research Data Express (1)
battery (1)
compound semiconductor (1)
(more)
ライセンス
In Copyright (8)
Creative Commons BY Attribution 4.0 International (2)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (14)
application/zip (9)
text/csv (2)
application/octet-stream (1)
application/xml (1)