2 件のレコードが見つかりました。
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
- ジャーナル論文
- 著者
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;Shunichi Yoneda (author) (この著者で検索)Ryo Murakami (author) (この著者で検索)National Institute for Materials Science
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Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
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Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
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Shigeo Tanuma (author) (この著者で検索)National Institute for Materials Science
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;Hiromi Tanaka (author) (この著者で検索);Hayaru Shouno (author) (この著者で検索)Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
- キーワード
- X-ray photoelectron spectroscopy, Survey spectrum, Surrogate model, Total electron attenuation length, Thickness estimation
- 刊行年月日
- 2026-03-31
- 更新時刻
- 2026-04-16 15:42:06 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- ジャーナル論文
- 著者
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;Atsushi Machida (author) (この著者で検索)Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
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Ryo Murakami (author) (この著者で検索)National Institute for Materials Science
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Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
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;Hayaru Shouno (author) (この著者で検索)Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
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Masato Okada (author) (この著者で検索)
- キーワード
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- 刊行年月日
- 2024-05-29
- 更新時刻
- 2025-11-10 12:30:27 +0900