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3358 件のレコードが見つかりました。
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
- ジャーナル論文
- コレクション
- The history of DICE and NIMS Digital Library
- 著者
-
TANIFUJI, Mikiko (author) (この著者で検索)
;
YOSHIKAWA, Hideki (author) (この著者で検索)
- キーワード
- 研究データ, マテリアル・インフォマティクス, メタデータスキーマ, データフロー, 相互利用 FAIR, 材料データプラットフォーム DICE, データ リポジトリ
- 刊行年月日
- 2021-04-15
- 更新時刻
- 2022-10-03 01:48:19 +0900
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
;
Yoshikawa, Hideki (author) (この著者で検索)
- キーワード
- Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2020-06-04
- 更新時刻
- 2022-10-03 01:48:14 +0900
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告（I）
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Tanuma, Shigeo (author) (この著者で検索)
- キーワード
- Auger Depth Profiling Analysis, InP/GaInAs Specimen, Round Robin Test
- 刊行年月日
- 1995-11-16
- 更新時刻
- 2022-10-03 01:55:14 +0900
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Tanuma, Shigeo (author) (この著者で検索)
- キーワード
- Auger Depth Profiling Analysis, SiO2/Si, Sample Cooling Method
- 刊行年月日
- 1996-02-08
- 更新時刻
- 2022-10-03 01:39:59 +0900
Data-based selection of creep constitutive models for high-Cr heat-resistant steel
- ジャーナル論文
- 著者
-
Izuno, Hitoshi (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Demura, Masahiko (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Tabuchi, Masaaki (author) (この著者で検索)National Institute for Materials Science Research Center for Structural Materials
;
;Mototake, Yoh-ichi (author) (この著者で検索)The Institute of Statistical MathematicsOkada, Masato (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
- キーワード
- theta method, Creep constitutive equation, model selection method, bayesian free energy, steady-state creep, grade 91 steel
- 刊行年月日
- 2020-01-31
- 更新時刻
- 2024-01-05 22:12:23 +0900
A universal Bayesian inference framework for complicated creep constitutive equations
- ジャーナル論文
- 著者
-
Izuno, Hitoshi (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
;Mototake, Yoh-ichi (author) (この著者で検索)The Institute of Statistical MathematicsNagata, Kenji (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Demura, Masahiko (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Okada, Masato (author) (この著者で検索)University of Tokyo Graduate School of Frontier Sciences
- キーワード
- Materials science, Metals and alloys, Structural materials
- 刊行年月日
- 2020-06-26
- 更新時刻
- 2024-01-05 22:13:52 +0900
Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
- ジャーナル論文
- 著者
-
KOYAMA, Yukinori (author) (この著者で検索)
;
SEKO, Atsuto (author) (この著者で検索)
https://orcid.org/0000-0002-2473-3837
(unauthenticated)
;
TANAKA, Isao (author) (この著者で検索)
https://orcid.org/0000-0002-4616-118X
(unauthenticated)
;
FUNAHASHI, Shiro (author) (この著者で検索)
;
HIROSAKI, Naoto (author) (この著者で検索)
- キーワード
- materials informatics, density functional theory calculation, materials search
- 刊行年月日
- 2021-06-14
- 更新時刻
- 2024-01-05 22:12:06 +0900
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
- ジャーナル論文
- 著者
-
Tanuma, Shigeo (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Kim, Kyung Joong (author) (この著者で検索)
https://orcid.org/0000-0001-5559-9784
(unauthenticated)
;
Nagatomi, Takaharu (author) (この著者で検索)
https://orcid.org/0000-0002-3629-638X
(unauthenticated)
- キーワード
- Auger Depth Profiling Analysis, Si/Ge multiple delta-doped layers, GaAs/AlAs Superlattice, Inclined Holder
- 刊行年月日
- 2016-04-03
- 更新時刻
- 2024-01-05 22:13:47 +0900
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Yanagiuchi, Katsuaki (author) (この著者で検索)
https://orcid.org/0000-0002-3882-8052
(unauthenticated)
;
Yoshikawa, Hideki (author) (この著者で検索)
- キーワード
- Ultra Low Angle Incidence Ion Beam, FeNi/CoFeB/FeNi Thin Film, Auger Depth Profiling Analysis
- 刊行年月日
- 2019-03-31
- 更新時刻
- 2024-01-05 22:13:23 +0900
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Tanuma, Shigeo (author) (この著者で検索)
- キーワード
- argon ion sputtering, compound semiconductor, surface observation using a scanning electron microscope
- 刊行年月日
- 1995-03-08
- 更新時刻
- 2022-10-03 01:31:38 +0900