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HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
HfO2-Fig8-Work-20220304-2.pdf
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
1-s2.0-S2949822825002953-main.pdf
Synthesis of mesoporous SiO2–Al2O3 hollow spheres using ultrasonic irradiation and their activity for hydrolysis of ammonia borane
ジャーナル論文
著者
Naoki Toyama (author) (この著者で検索)
;
Takehiro Nagashima (author) (この著者で検索)
;
Kaori Wada (author) (この著者で検索)
;
Kenzo Deguchi (author) (この著者で検索)
;
Shinobu Ohki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yuuki Mogami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masataka Tansho (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Atsushi Goto (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shigeki Furukawa (author) (この著者で検索)
キーワード
Hollow spheres, Ultrasonic irradiation, Ammonia borane, Mesoporous, Silica–alumina
刊行年月日
2025-06-04
更新時刻
2025-07-11 12:30:26 +0900
s41427-024-00544-w.pdf
Direct observation of the atomic density fluctuation originating from the first sharp diffraction peak in SiO2 glass
ジャーナル論文
著者
Akihiko Hirata (author) (この著者で検索)
ORCID ;
Shuya Sato (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
glass, structure, fluctuation
刊行年月日
2024-05-10
更新時刻
2024-05-14 12:30:18 +0900
2026-Sinmyo-et-al.pdf
Cold SiO2-rich slabs reaching the CMB revealed by the seifertite phase boundary
ジャーナル論文
著者
Ryosuke Sinmyo (author) (この著者で検索)
;
Saori Kawaguchi-Imada (author) (この著者で検索)
;
Rei Sato (author) (この著者で検索)
;
Keisuke Otsuru (author) (この著者で検索)
;
Kenji Kawai (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Takayuki Ishii (author) (この著者で検索)
;
Shuhou Maitani (author) (この著者で検索)
キーワード
DFT, Seifertite
刊行年月日
2026-05-30
更新時刻
2026-08-31 17:52:18 +0900
Nabatame_d-SiO2-Ga2O3 2026_ECS_J._Solid_State_Sci._Technol._15_064005.pdf
Characteristics of β-Ga2O3/Al2O3/Pt capacitors with a Ga2O3 surface modified using the dummy-SiO2 process
ジャーナル論文
著者
Toshihide Nabatame (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)
ORCID SAMURAI ;
Yoshihiro Irokawa (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Ultra-wide Bandgap Semiconductors Group
ORCID SAMURAI ;
Tomomi Sawada (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group
;
Hiromi Miura (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group
;
Manami Miyamoto (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group
;
Takashi Onaya (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group
ORCID ;
Yasuo Koide (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Next-generation Semiconductor Group
ORCID SAMURAI ;
Kazuhito Tsukagoshi (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group
ORCID SAMURAI
キーワード
Ga2O3, atomic layer deposition, dummy-SiO2, Al2O3, positive bias stress
刊行年月日
2026-06-01
更新時刻
2026-08-18 11:30:17 +0900
EnergyStorageMater66(2024)103200.pdf
Unified understanding and mitigation of detrimental phase transition in cobalt-free LiNiO2
ジャーナル論文
著者
Itsuki Konuma (author) (この著者で検索)
;
Naohiro Ikeda (author) (この著者で検索)
;
Benoît D.L. Campéon (author) (この著者で検索)
;
Hinata Fujimura (author) (この著者で検索)
;
Jun Kikkawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Huu Duc Luong (author) (この著者で検索)
National Institute for Materials Science
;
Yoshitaka Tateyama (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yosuke Ugata (author) (この著者で検索)
;
Masao Yonemura (author) (この著者で検索)
;
Toru Ishigaki (author) (この著者で検索)
;
Taira Aida (author) (この著者で検索)
;
Naoaki Yabuuchi (author) (この著者で検索)
キーワード
Lithium nickelate, Phase transition, Nickel migration, Structural disordering
刊行年月日
2024-01-18
更新時刻
2024-08-20 12:30:31 +0900
1-s2.0-S0040609024003493-main.pdf
Compositional changes between metastable SnO and stable SnO2 in a sputtered film for p-type thin-film transistors
ジャーナル論文
著者
ORCID ;
Toshihide Nabatame (author) (この著者で検索)
;
Jong Won Chung (author) (この著者で検索)
ORCID ;
Tomomi Sawada (author) (この著者で検索)
;
Hiromi Miura (author) (この著者で検索)
;
Manami Miyamoto (author) (この著者で検索)
;
Kazuhito Tsukagoshi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
p-type SnO, Thin-film transistors, Sputtering, High vacuum Annealing
刊行年月日
2024-10-09
更新時刻
2024-10-15 16:30:30 +0900
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