Keyword: focused ion beam
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5 records found.

Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam.pdf
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
Journal article
Creator
Shuai Tang (author) (Search by this author)
; ORCID SAMURAI ;
Yimeng Wu (author) (Search by this author)
;
You-Hu Chen (author) (Search by this author)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Lu-Chang Qin (author) (Search by this author)
Keyword
electron emission, transmission electron microscopy, focused ion beam
Date published
2025-03-06
Updated at
2025-04-12 08:30:10 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled STEM lamella preparation via FIB-SEM.pdf
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
Journal article
Creator
ORCID SAMURAI ;
Yuanzhao Yao (author) (Search by this author)
; ORCID SAMURAI ;
Takashi Sekiguchi (author) (Search by this author)
Keyword
transmission electron microscopy, scanning electron microscopy, focused ion beam
Date published
2025-08-01
Updated at
2026-01-31 16:30:04 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
Systematic study of FIB-induced damage for the high-quality TEM sample preparation.pdf
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI
Keyword
focused ion beam, transmission electron microscopy
Date published
2024-04-26
Updated at
2024-05-07 15:32:35 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy, automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900