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Resource type
Journal article(3)
Keyword
effective attenuation length (3)
IMFP (2)
EAL (1)
Electron Inelastic Mean Free Path (1)
attenuation length (1)
inelastic mean free path (1)
inelastic scattering effect (1)
information depth (1)
liquid water (1)
mean escape depth (1)
(more)
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International (2)
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application/pdf (2)
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Keyword: effective attenuation length
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3 records found.
表面電子分光法における電子の散乱効果の研究
Journal article
Creator
田沼繁夫
(author) (
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)
https://orcid.org/0000-0003-2628-9941
物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼繁夫
Keyword
attenuation length
,
effective attenuation length
,
IMFP
,
inelastic scattering effect
,
surface electron spectroscopies
Date published
2007-04-04
Updated at
2024-01-05 22:11:57 +0900
電子分光法における表面感度と検出深さ
Journal article
Creator
田沼 繁夫
(author) (
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)
https://orcid.org/0000-0003-2628-9941
統合型材料開発・情報基盤部門/材料データプラットフォームセンター/データサービスチーム, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼 繁夫
Keyword
surface sensitivity
,
mean escape depth
,
effective attenuation length
,
information depth
,
inelastic mean free path
Date published
2022-03-10
Updated at
2024-01-05 22:12:47 +0900
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV
Journal article
Creator
Shinotsuka, Hiroshi
(author) (
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)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Shinotsuka, Hiroshi
;
Da, Bo
(author) (
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)
https://orcid.org/0000-0002-0785-8662
NIMS Researchers Directory SAMURAI
Da, Bo
;
Tanuma, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Yoshikawa, Hideki
(author) (
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)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Yoshikawa, Hideki
;
Powell , Cedric J
(author) (
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)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell , Cedric J
;
Penn, David R
(author) (
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)
Penn, David R
Keyword
effective attenuation length
,
liquid water
,
relativistic full Penn algorithm
,
relativistic TPP-2M
,
IMFP
,
static structure factor
,
Electron Inelastic Mean Free Path
,
EAL
Date published
2016-08-30
Updated at
2024-01-05 22:13:02 +0900
Keyword
effective attenuation length
(3)
IMFP
(2)
EAL
(1)
Electron Inelastic Mean Free Path
(1)
attenuation length
(1)
inelastic mean free path
(1)
inelastic scattering effect
(1)
information depth
(1)
liquid water
(1)
mean escape depth
(1)
relativistic TPP-2M
(1)
relativistic full Penn algorithm
(1)
static structure factor
(1)
surface electron spectroscopies
(1)
surface sensitivity
(1)
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