オージェ電子分光法における背面散乱補正 I．広い分析条件で使用可能な電子の背面散乱補正式の開発
- ジャーナル論文
- 著者
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田沼 繁夫 (author) (この著者で検索)
- キーワード
- Auger electron spectroscopy, AES, electron backscattering correction, predictive formula for back scattering correction
- 刊行年月日
- 2018-10-19
- 更新時刻
- 2024-01-05 22:13:01 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- ジャーナル論文
- 著者
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Tanuma, Shigeo (author) (この著者で検索)
;
Powell, C. J. (author) (この著者で検索)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (この著者で検索) - キーワード
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- 刊行年月日
- 2003-02-11
- 更新時刻
- 2022-10-03 01:54:38 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ジャーナル論文
- 著者
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TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- 刊行年月日
- 2005-12-28
- 更新時刻
- 2024-01-05 22:11:34 +0900