detector">
説明:
(abstract)A Cu(In,Ga)Se2 (CIGS) semiconductor has been widely developed as a solar cell. It is known to have a radiation damage recovery mechanism brought about by a process of thermal annealing. We investigated the radiation damage recovery mechanism though two irradiation experiments at HIMAC and CYRIC. In the HIMAC experiment, a 2 μm-thick CIGS detector was irradiated with a 400 MeV/u Xe ion (132Xe+54) beam, and the collected charge from Xe signal was observed. After Xe beam irradiation with a dose of 0.6 MGy, collected charge from the Xe beam was deteriorated to 51% of initial state. However, it recovered to 97% after 2 h dark annealing at 130 ◦C. In the CYRIC experiment, 70 MeV protons with a fluence of 7.5×1015 MeV neq∕cm2 were irradiated to CIGS solar cells. After dark annealing at 130 ◦C for 1 h, a short circuit current density (JSC) recovered from 57% to 85% of the initial state. On the other hand, it took about 34 h for the JSC to recover from 50% to 85% at 90 ◦C. From these two irradiation experiments, it appeared that the radiation damage recovery mechanism is effective for the CIGS detector, the amount of recovery having a strong dependence on annealing temperature.
権利情報:
キーワード: Cu(In, Ga)Se2, Radiation tolerance, Radiation detector
刊行年月日: 2024-07-20
出版者: Elsevier BV
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4723
公開URL: https://doi.org/10.1016/j.nima.2024.169637
関連資料:
その他の識別子:
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更新時刻: 2024-09-04 09:31:35 +0900
MDRでの公開時刻: 2026-07-20 08:27:11 +0900
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