Index Catalog // MDR

First-principles calculations of optical constants

Description/Abstract:: The energy loss function (ELF) describes the interaction between electrons and matter in solids. It is essential for understanding quanti...
Keyword:: compound semiconductor, energy loss function, first-principles calculation, and optical constant
Resource Type:: Dataset
Data origin:: simulations
Author:: SHINOTSUKA, Hiroshi, YOSHIKAWA, Hideki, and TANUMA, Shigeo
Journal:: e-Journal of Surface Science and Nanotechnology
Date Uploaded:: 18/01/2021
Date Modified:: 07/07/2021

Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as an IoT Device

Description/Abstract:: 実験・計算・データ科学を融合させた材料の研究開発を推進するマテリアルズインフォマティクス(MI)が推進されているが、実験データの収集については既存データベースのインポートや出版済み論文のデータマイニングに限られる場合が多い。効果的な MI のためには各種装置から自動的に実験...
Keyword:: FlashAir, IoT, Wi-Fi, and data transfer
Resource Type:: Presentation
Author:: MATSUDA, Asahiko, YOSHIKAWA, Hideki, and CHIKYOW, Toyohiro
Date Uploaded:: 23/10/2020
Date Modified:: 01/07/2021

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:: Auger Depth Profiling analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Yoshikawa, Hideki, Ogiwara, Toshiya, and Nagata, Takahiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 25/05/2021
Date Modified:: 26/05/2021

Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Description/Abstract:: We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:: MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth
Resource Type:: Article
Author:: Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 26/06/2020
Date Modified:: 02/07/2021

Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV

Description/Abstract:: It is very important to know details of the interactions of low-energy electron with liquid water for many biological applications. There...
Keyword:: IMFP and liquid water
Resource Type:: Presentation
Author:: TANUMA, Shigeo, SHINOTSUKA, Hiroshi, DA, Bo, YOSHIKAWA, Hideki, and パウエル
Date Uploaded:: 29/06/2023

電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討-, Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–

Description/Abstract:: 電子線マイクロアナライザーは広く材料の分析に用いられ，定量分析法はZAF法としてほぼ確立されている．しかし，Mg-Ge合金においては，定量分析の結果MgとGeの濃度の合計120wt.% と異常な値を示した．しかも電子線の加速電圧が高くなるに従ってMgの定量値が上昇する．こ...
Keyword:: Mg-Ge alloy, ZAF, electron probe microanalyzer, and mass absorption coefficient
Resource Type:: Article
Author:: Nishio, Mitsuaki, Imai, Motoharu, Tanuma, Shigeo, Yoshikawa, HIdeki, and Isoda, Yukihiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 20/07/2020
Date Modified:: 22/07/2020

材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題

Description/Abstract:: In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:: 研究データ, データフロー, 相互利用 FAIR, 材料データプラットフォーム DICE, データリポジトリ, メタデータスキーマ, and マテリアル・インフォマティクス
Resource Type:: Article
Author:: TANIFUJI, Mikiko and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 25/08/2021
Date Modified:: 25/08/2021

材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤

Description/Abstract:: 材料分野でのデータ駆動型の材料研究の進展のため、物質･材料研究機構（National Institute for Materials Science, NIMS）は材料データプラットフォームシステムの開発に2017年に着手し、2020年からサービス名 DICE として所...
Keyword:: 研究データ, データフロー, FAIR, DICE, マテリアル・インフォマティクス, 語彙管理, and データ構造化
Resource Type:: Presentation
Author:: TANIFUJI, Mikiko, MATSUDA, Asahiko, and YOSHIKAWA, Hideki
Date Uploaded:: 02/03/2022
Date Modified:: 02/03/2022

Automated information compression of XPS spectrum using information criteria

Description/Abstract:: We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:: X-ray photoelectron spectroscopy (XPS), Active Shirley method, Akaike information criterion (AIC), and Bayesian information criterion (BIC)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Yoshikawa, Hideki, Murakami, Ryo, Nakamura, Kazuki, Tanaka, Hiromi, and Yoshihara, Kazuhiro
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 10/06/2022
Date Modified:: 17/06/2022

IoT データ収集システムのデータアーキテクチャ

Description/Abstract:: With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:: データアーキテクチャ, IoT, データ収集システム, メタデータ, and XML スキーマ
Resource Type:: Article
Author:: MATSUNAMI, Shigeyuki, MATSUDA, Asahiko, CHIKYOW, Toyohiro, HARADA, Yoshitomo, and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 26/08/2021
Date Modified:: 26/08/2021

First-principles calculations of optical constants

Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as an IoT Device

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV

電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討-, Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–

材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題

材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤

Automated information compression of XPS spectrum using information criteria

IoT データ収集システムのデータアーキテクチャ

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