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"YOSHIKAWA, Hideki"
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Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
Description/Abstract:
It is very important to know details of the interactions of low-energy electron with liquid water for many biological applications. There...
Keyword:
IMFP
and
liquid water
Resource Type:
Presentation
Author:
TANUMA, Shigeo
,
SHINOTSUKA, Hiroshi
,
DA, Bo
,
YOSHIKAWA, Hideki
, and
パウエル
Date Uploaded:
29/06/2023
Materials Data Platform: a constellation of systems to promote materials data-oriented science
Description/Abstract:
A constellation of research data systems is being developed, to boost a more data-oriented approach to materials science. Four main funct...
Keyword:
Data-oriented science
,
Database
,
Materials data platform
,
Materials digital transform
,
Materials informatics
,
Metadata
, and
Research data management
Resource Type:
Poster
Author:
MATSUDA Asahiko
,
KADOHIRA Takuya
,
YOSHIKAWA Hideki
,
ISHII Masashi
,
DEMURA Masahiko
, and
TANIFUJI Mikiko
Date Uploaded:
21/01/2023
Date Modified:
30/03/2024
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
Description/Abstract:
There is a need to develop an automatic spectral analysis method integrated with reference database as the reference database builds up. ...
Keyword:
X-ray photoelectron spectroscopy
,
Automatic spectrum analysis
,
Bayesian information criterion
, and
Multiple core level spectra
Resource Type:
Article
Author:
Murakami, Ryo
,
Tanaka, Hiromi
,
Shinotsuka Hiroshi
,
Nagata, Kenji
, and
Yoshikawa, Hideki
Journal:
Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:
15/06/2022
Date Modified:
17/06/2022
Automated information compression of XPS spectrum using information criteria
Description/Abstract:
We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:
X-ray photoelectron spectroscopy (XPS)
,
Active Shirley method
,
Akaike information criterion (AIC)
, and
Bayesian information criterion (BIC)
Resource Type:
Article
Author:
Shinotsuka, Hiroshi
,
Yoshikawa, Hideki
,
Murakami, Ryo
,
Nakamura, Kazuki
,
Tanaka, Hiromi
, and
Yoshihara, Kazuhiro
Journal:
Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:
10/06/2022
Date Modified:
17/06/2022
材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤
Description/Abstract:
材料分野でのデータ駆動型の材料研究の進展のため、物質 ・ 材料研究機構(National Institute for Materials Science, NIMS)は材料データプラットフォームシステムの開発に2017年に着手し、2020年からサービス名 DICE として所...
Keyword:
研究データ
,
データフロー
,
FAIR
,
DICE
,
マテリアル・インフォマティクス
,
語彙管理
, and
データ構造化
Resource Type:
Presentation
Author:
TANIFUJI, Mikiko
,
MATSUDA, Asahiko
, and
YOSHIKAWA, Hideki
Date Uploaded:
02/03/2022
Date Modified:
02/03/2022
IoT データ収集システムのデータアーキテクチャ
Description/Abstract:
With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:
データアーキテクチャ
,
IoT
,
データ収集システム
,
メタデータ
, and
XML スキーマ
Resource Type:
Article
Author:
MATSUNAMI, Shigeyuki
,
MATSUDA, Asahiko
,
CHIKYOW, Toyohiro
,
HARADA, Yoshitomo
, and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
26/08/2021
Date Modified:
26/08/2021
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
Description/Abstract:
In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:
研究データ
,
データフロー
,
相互利用 FAIR
,
材料データプラットフォーム DICE
,
データ リポジトリ
,
メタデータスキーマ
, and
マテリアル・インフォマティクス
Resource Type:
Article
Author:
TANIFUJI, Mikiko
and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
25/08/2021
Date Modified:
25/08/2021
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために,極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った.その...
Keyword:
Auger Depth Profiling Analysis
,
Ultra Low Angle Incidence Ion Beam
, and
FeNi/CoFeB/FeNi Thin Film
Material/Specimen:
FeNi/CoFeB/FeNi Thin Film
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Yanagiuchi, Katsuaki
, and
Yoshikawa, Hideki
Journal:
Journal of Surface Analysis
Date Uploaded:
28/05/2021
Date Modified:
04/06/2021
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:
Auger Depth Profiling analysis
,
HfO2/Si
, and
Ultra Low Angle Incidence Ion Beam
Material/Specimen:
HfO2
Resource Type:
Article
Author:
Yoshikawa, Hideki
,
Ogiwara, Toshiya
, and
Nagata, Takahiro
Journal:
Journal of Surface Analysis
Date Uploaded:
25/05/2021
Date Modified:
26/05/2021
First-principles calculations of optical constants
Description/Abstract:
The energy loss function (ELF) describes the interaction between electrons and matter in solids. It is essential for understanding quanti...
Keyword:
compound semiconductor
,
energy loss function
,
first-principles calculation
, and
optical constant
Resource Type:
Dataset
Data origin:
simulations
Author:
SHINOTSUKA, Hiroshi
,
YOSHIKAWA, Hideki
, and
TANUMA, Shigeo
Journal:
e-Journal of Surface Science and Nanotechnology
Date Uploaded:
18/01/2021
Date Modified:
07/07/2021
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The history of DICE and NIMS Digital Library
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IMFP
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liquid water
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
5
Creative Commons BY Attribution 4.0 International
4
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4
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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density functional theory or electronic structure
1
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1
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electrical -- dielectric constant and spectra
1
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FeNi/CoFeB/FeNi Thin Film
1
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1
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2019
1
Author
YOSHIKAWA, Hideki
6
Yoshikawa, Hideki
6
MATSUDA, Asahiko
3
Shinotsuka, Hiroshi
3
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https://creativecommons.org/licenses/by/4.0/
1
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Journal of Surface Analysis
3
Journal of Electron Spectroscopy and Related Phenomena
2
情報処理学会論文誌デジタルプラクティス
2
Journal of Electron Spectroscopy and Related Phenomena
1
Surface and Interface Analysis
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