Skip to Content
Toggle navigation
Home
About
Help
Contact
Login
Search MDR
Go
Search Constraints
Start Over
Filtering by:
Keyword
Silicon (wafer)
Remove constraint Keyword: Silicon (wafer)
1
entry found
Sort by relevance
relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Slideshow
Search Results
XAFS spectrum of Silicon (wafer)
Description/Abstract:
This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...
Keyword:
BL-10
,
Pure metal
,
Ritsumeikan-SR
,
Si
,
Si K-edge
,
Silicon (wafer)
,
XAFS
, and
collection - MDR XAFS DB
Resource Type:
Dataset
Data origin:
experiments
Date Uploaded:
08/06/2022
Toggle facets
Limit your search
Type of work
Dataset
1
Collection
MDR XAFS DB
1
Keyword
BL-10
1
Pure metal
1
Ritsumeikan-SR
1
Si
1
Si K-edge
1
more
Keywords
»
Resource type
Dataset
1
Visibility
open
1
Rights Statement Sim
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International
1
Data origin
experiments
1
Characterization methods
spectroscopy -- x-ray absorption spectroscopy
1
Instrument manufacturer
Ritsumeikan SR Center
1
Instrument managing organization
Ritsumeikan University
1
Instrument managing sub organization
Ritsumeikan SR Center
1
Structural feature category
https://matvoc.nims.go.jp/entity/Q686
1