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Filtering by: Instrument manufacturer Ritsumeikan SR Center Keyword Silicon (wafer)

1. XAFS spectrum of Silicon (wafer)

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...
Keyword:: BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (wafer), XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022