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Filtering by: Instrument manufacturer Japan Synchrotron Radiation Research Institute Keyword Ta L3-edge Keyword TaN

XAFS spectrum of Tantalum nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...

Keyword:

BL14B2, Nitride, SPring-8, Si(311), Ta L3-edge, TaN, Tantalum nitride, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Tantalum nitride

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

24/07/2021
XAFS spectrum of Tantalum nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...

Keyword:

BL14B2, Nitride, SPring-8, Si(111), Ta L3-edge, TaN, Tantalum nitride, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Tantalum nitride

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

21/07/2021