Dataset

XAFS spectrum of Tantalum nitride

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This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, and is a part of XAFS database (MDR XAFS DB,  https://doi.org/10.48505/nims.1447) as a collection of MDR

Description

DOI
Creator
Keyword
Resource type
Data origin
Material/Specimen
  • Tantalum nitride
Rights statement
Identifier
  • Identifier - Local
    RDEtag-68343880
    Identifier - Persistent
    urn:DATA_IDENTIFIER.dpfc.nims.go.jp:251b9ae0-1ee0-4676-adc2-85edefdd4503

Method

Instruments

Instrument

Specimen details

Specimen type
  • Title
    Tantalum nitride
    Chemical composition
    Description
    TaN
    Description
    Standard Sample
    Structural feature
    Category
    local structure
    Sub category
    radial distribution function

Preview: primary.tsv

Items

Thumbnail Title Date Uploaded Size Visibility Actions
metadata.all.json 6.53 KB MDR Open
metadata.all.yml 3.34 KB MDR Open
primary.tsv 5.25 KB MDR Open
RDEmetainfo.xml 43.1 KB MDR Open
Ta-L3_TaN_Si111_50ms_200625.dat 234 KB MDR Open
Ta-L3_TaN_Si111_50ms_200625.ex3 15.1 KB MDR Open
Ta-L3_TaN_Si111_50ms_200625.txt 14.8 KB MDR Open
TaN.thumb.png 31.7 KB MDR Open