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Filtering by: Instrument manufacturer Japan Synchrotron Radiation Research Institute Keyword Nitride Keyword Ta L3-edge Keyword XAFS

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...
Keyword:: BL14B2, Nitride, SPring-8, Si(311), Ta L3-edge, TaN, Tantalum nitride, XAFS, and collection - MDR XAFS DB
Material/Specimen:: Tantalum nitride
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 24/07/2021

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...
Keyword:: BL14B2, Nitride, SPring-8, Si(311), Ta L3-edge, Ta3N5, Tantalum nitride, XAFS, and collection - MDR XAFS DB
Material/Specimen:: Tantalum nitride
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 21/07/2021

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...
Keyword:: BL14B2, Nitride, SPring-8, Si(111), Ta L3-edge, Ta3N5, Tantalum nitride, XAFS, and collection - MDR XAFS DB
Material/Specimen:: Tantalum nitride
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 21/07/2021

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L3-edge of Tantalum nitride measured at SPring-8 BL14B2, an...
Keyword:: BL14B2, Nitride, SPring-8, Si(111), Ta L3-edge, TaN, Tantalum nitride, XAFS, and collection - MDR XAFS DB
Material/Specimen:: Tantalum nitride
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 21/07/2021

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