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Filtering by: Instrument managing organization Ritsumeikan University Instrument manufacturer Ritsumeikan SR Center Keyword Silicon carbide

XAFS spectrum of Silicon carbide

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Carbide, Ritsumeikan-SR, Si K-edge, SiC, Silicon carbide, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022