Index Catalog // MDR

Start Over

Filtering by: Instrument managing organization Ritsumeikan University Instrument managing sub organization Ritsumeikan SR Center Keyword BL-10 Keyword Silicon carbide

XAFS spectrum of Silicon carbide

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Carbide, Ritsumeikan-SR, Si K-edge, SiC, Silicon carbide, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022

XAFS spectrum of Silicon carbide

Limit your search

Type of work

Collection

Keyword

Resource type

Visibility

Rights Statement Sim

Data origin

Characterization methods

Instrument manufacturer

Instrument managing organization

Instrument managing sub organization

Structural feature category

Search Constraints

Search Results

Limit your search