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Filtering by: Type of work Dataset Instrument managing organization Ritsumeikan University Keyword Pure metal Keyword XAFS

1. XAFS spectrum of Silicon (powder)

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (powder) measured at Ritsumeikan-SR BL-10...
Keyword:: BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (powder), XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022

2. XAFS spectrum of Silicon (wafer)

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...
Keyword:: BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (wafer), XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022

3. XAFS spectrum of Aluminum

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Al K-edge of Aluminum measured at Ritsumeikan-SR BL-10, and is...
Keyword:: Al, Al K-edge, Aluminum, BL-10, Pure metal, Ritsumeikan-SR, XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022