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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Description/Abstract:: ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:: AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor
Resource Type:: Article
Author:: TANUMA, Shigeo
Journal:: Surface and Interface Analysis
Date Uploaded:: 08/10/2020
Date Modified:: 01/07/2021

Calculations of Electron Inelastic Mean Free Paths for 31 Materials

Description/Abstract:: We present new calculations of electron inelastic mean free paths (IMFPs) for 200-2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V,...
Keyword:: Bethe equation, IMFP, TPP, elemental solids, and inelastic mean free path
Resource Type:: Article
Author:: Tanuma, S., Powell, C. J., and Penn, D. R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 05/06/2023
Date Modified:: 09/06/2023

Calculations of Electron Inelastic Mean Free Paths III. Data for 15 Inorganic compounds over the 50 - 2000 eV Range

Description/Abstract:: We report calculations of electron inelastic mean free path (IMFPs) of 50-2000 eV electrons in a group of 15 inorganic compounds (Al2O3, ...
Keyword:: IMFP, Inorganic compounds, and TPP-2
Resource Type:: Article
Author:: Tanuma, Shigeo, Powell, C. J., and Penn, D. R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 03/08/2023

Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV

Description/Abstract:: We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:: EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R
Journal:: Surface and Interface Analysis
Date Uploaded:: 31/07/2020
Date Modified:: 02/07/2021

Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range

Description/Abstract:: We report calculations of electron inelastic mean free paths (IMFPs) of 50–2000 eV electrons for a group of 14 organic compounds: 26-n-pa...
Keyword:: IMFP, IMFP predictive formula, Penn algorithm, TPP-2M, electron inelastic mean free path, and organic compounds
Resource Type:: Article
Author:: Shigeo Tanuma
Journal:: Surface and Interface Analysis
Date Uploaded:: 29/05/2023
Date Modified:: 30/05/2023

Calculations of Electron Inelastic Mean Free Paths (IMFPs). XIV. Calculated IMFPs for LiF and Si3N4 and Development of an Improved Predictive IMFP Formula

Description/Abstract:: We report inelastic mean free paths (IMFPs) of Si3N4 and LiF for electron energies from 50 eV to 200 keV that were calculated from their ...
Keyword:: IMFP, Improved Predictive IMFP Formula, JTP equation, TPP-2M, and electron inelastic mean free path
Resource Type:: Article
Author:: Jablonski, Aleksander, Tanuma, Shigeo, and Powell, C. Cedric
Journal:: Surface and Interface Analysis
Date Uploaded:: 29/05/2023
Date Modified:: 06/06/2023

Calculations of Electron Inelastic Mean Free Paths II. Data for 27 Elements over the 50 - 2000 eV Range

Description/Abstract:: We report calculations of electron inelastic mean free paths (IMFPs) for 50-2000 eV electrons in a group of 27 elements (C, Mg, Al, Si, T...
Keyword:: IMFPs, TPP-2, a group of 27 elements, and electron inelastic mean free paths
Resource Type:: Article
Author:: Tanuma, S., Powell, C. J., and Penn, D. R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 12/07/2023

Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

Description/Abstract:: We have calculated inelastic mean free paths (IMFPs) for 42 inorganic compounds (AgBr, AgCl, AgI, Al2O3, AlAs, AlN, AlSb, cubic BN, hexa...
Keyword:: Electron Inelastic Mean Free Path, IMFP, and TPP-2M
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Tanuma, Shigeo, Powell, Cedric J., and Penn, Dave R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 26/06/2020
Date Modified:: 08/07/2021

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

Description/Abstract:: <h4>Abstract</h4> We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na,...
Keyword:: electron inelastic mean free path, inelastic mean free paths, predictive equation for IMFP, elemental solid, relativistic Bethe equation, Fano plot, IMFP, ELF, energy loss function, optical constant, relativistic full Penn algorithm, full Penn algorithm, FPA, TPP-2M, and relativistic TPP-2M
Material/Specimen:: 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, TANUMA, Shigeo, Powell, Cedric J., and Penn, David R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 01/04/2021
Date Modified:: 19/07/2021

Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV

Description/Abstract:: We have made additional evaluations of the electron inelastic mean free paths ([MFPs) and of the predictive IMFP formula TPP-2 presented ...
Keyword:: Evaluations of TPP-2 formula, IMFP, and predictive IMFP formula TPP-2
Resource Type:: Article
Author:: Tanuma, S., Powell, C. J., and Penn, D. R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 07/11/2023
Date Modified:: 07/11/2023

Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Calculations of Electron Inelastic Mean Free Paths for 31 Materials

Calculations of Electron Inelastic Mean Free Paths III. Data for 15 Inorganic compounds over the 50 - 2000 eV Range

Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV

Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range

Calculations of Electron Inelastic Mean Free Paths (IMFPs). XIV. Calculated IMFPs for LiF and Si3N4 and Development of an Improved Predictive IMFP Formula

Calculations of Electron Inelastic Mean Free Paths II. Data for 27 Elements over the 50 - 2000 eV Range

Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV

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