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Hideki Yoshikawa
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Sample structure prediction from measured XPS data using Bayesian estimation and SESSA...
Machine learning approach for the prediction of electron inelastic mean free paths
Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo
Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene
Virtual substrate method for nanomaterials characterization
Development of multiple core-level XPS spectra decomposition method based on the Bayes...
Automated information compression of XPS spectrum using information criteria
材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤
IoT データ収集システムのデータアーキテクチャ
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
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Publication
17
Dataset
1
Collection
The history of DICE and NIMS Digital Library
3
Keyword
Ultra Low Angle Incidence Ion Beam
3
Auger Depth Profiling Analysis
2
HfO2/Si
2
IoT
2
X-ray photoelectron spectroscopy
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Language
English
10
Japanese
7
Publisher
Surface Analysis Society of Japan
4
Elsevier
3
American Physical Society (APS)
2
情報処理学会
2
American Chemical Society (ACS)
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Article
15
Presentation
2
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1
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open
18
Rights Statement Sim
In Copyright
8
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
6
Creative Commons BY Attribution 4.0 International
4
Computational methods
density functional theory or electronic structure
1
Data origin
simulations
1
Properties addressed
electrical -- dielectric constant and spectra
1
optical
1
Material/Specimen
HfO2
2
FeNi/CoFeB/FeNi Thin Film
1
Date accepted
2017
1
2019
1
2020
1
Date created
2021
1
Date submitted
2019
1
Author
Yoshikawa, Hideki
7
Hideki Yoshikawa
5
YOSHIKAWA, Hideki
5
Bo Da
4
Shigeo Tanuma
4
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License
https://creativecommons.org/licenses/by-nc-nd/4.0/
3
https://creativecommons.org/licenses/by/4.0/
1
Funder
JSPS KAKENHI
1
JST CREST
1
Journal
Journal of Surface Analysis
4
Journal of Electron Spectroscopy and Related Phenomena
2
情報処理学会論文誌デジタルプラクティス
2
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1
Journal of Electron Spectroscopy and Related Phenomena
1
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