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Virtual substrate method for nanomaterials characterization
MDR Open Deposited
Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. The virtual substrate method represents a benchmark for surface analysis to provide “free-standing” information about supported nanomaterials.
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- 26/05/2017
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