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Hideki Yoshikawa
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2 /Si by the glancing angle ion beam sputtering method at an incident angle...
Keyword:
Auger Depth Profiling Analysis
,
HfO2/Si
, and
Ultra Low Angle Incidence Ion Beam
Material/Specimen:
HfO2
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Nagata, Takahiro
, and
Yoshikawa, Hideki
Journal:
Journal of Surface Analysis
Date Uploaded:
19/08/2021
Date Modified:
20/08/2021
First-principles calculations of optical constants
Description/Abstract:
The energy loss function (ELF) describes the interaction between electrons and matter in solids. It is essential for understanding quanti...
Keyword:
compound semiconductor
,
energy loss function
,
first-principles calculation
, and
optical constant
Resource Type:
Dataset
Data origin:
simulations
Author:
SHINOTSUKA, Hiroshi
,
YOSHIKAWA, Hideki
, and
TANUMA, Shigeo
Journal:
e-Journal of Surface Science and Nanotechnology
Date Uploaded:
18/01/2021
Date Modified:
07/07/2021
Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as an IoT Device
Description/Abstract:
実験・計算・データ科学を融合させた材料の研究開発を推進するマテリアルズインフォマティクス(MI)が推進されているが、実験データの収集については既存データベースのインポートや出版済み論文のデータマイニングに限られる場合が多い。効果的な MI のためには各種装置から自動的に実験...
Keyword:
FlashAir
,
IoT
,
Wi-Fi
, and
data transfer
Resource Type:
Presentation
Author:
MATSUDA, Asahiko
,
YOSHIKAWA, Hideki
, and
CHIKYOW, Toyohiro
Date Uploaded:
23/10/2020
Date Modified:
01/07/2021
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:
Auger Depth Profiling analysis
,
HfO2/Si
, and
Ultra Low Angle Incidence Ion Beam
Material/Specimen:
HfO2
Resource Type:
Article
Author:
Yoshikawa, Hideki
,
Ogiwara, Toshiya
, and
Nagata, Takahiro
Journal:
Journal of Surface Analysis
Date Uploaded:
25/05/2021
Date Modified:
26/05/2021
Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo
Description/Abstract:
Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characte...
Keyword:
Plasmon Energy Gain
and
Secondary Electron
Resource Type:
Article
Author:
Bo Da
,
Jiangwei Liu
,
Yoshitomo Harada
,
Nguyen T. Cuong
,
Kazuhito Tsukagoshi
,
Jin Hu
,
Lihao Yang
,
Zejun Ding
,
Hideki Yoshikawa
, and
Shigeo Tanuma
Date Uploaded:
11/04/2023
Date Modified:
11/04/2023
Virtual substrate method for nanomaterials characterization
Description/Abstract:
Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials...
Keyword:
Virtual substrate method
Resource Type:
Article
Author:
Bo Da
,
Jiangwei Liu
,
Mahito Yamamoto
,
Yoshihiro Ueda
,
Kazuyuki Watanabe
,
Nguyen Thanh Cuong
,
Songlin Li
,
Kazuhito Tsukagoshi
,
Hideki Yoshikawa
,
Hideo Iwai
,
Shigeo Tanuma
,
Hongxuan Guo
,
Zhaoshun Gao
,
Xia Sun
, and
Zejun Ding
Date Uploaded:
28/02/2023
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
Description/Abstract:
We have developed a framework for solving the inverse problem of X-ray photoelectron spectroscopy (XPS) by incorporating an XPS simulator...
Keyword:
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
, and
X-ray photoelectron spectroscopy
Resource Type:
Article
Author:
Hiroshi Shinotsuka
,
Kenji Nagata
,
Malinda Siriwardana
,
Hideki Yoshikawa
,
Hayaru Shouno
, and
Masato Okada
Journal:
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Date Uploaded:
25/08/2023
Date Modified:
25/08/2023
Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene
Description/Abstract:
Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:
four-point probe technique
,
inelastic mean free path
, and
monolayer graphene
Resource Type:
Article
Author:
Bo Da
,
Yang Sun
,
Zhufeng Hou
,
Jiangwei Liu
,
Nguyen Thanh Cuong
,
Kazuhito Tsukagoshi
,
Hideki Yoshikawa
,
Shigeo Tanuma
,
Jin Hu
,
Zhaoshun Gao
, and
Zejun Ding
Date Uploaded:
04/04/2023
Date Modified:
05/04/2023
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
Description/Abstract:
We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:
MED
,
asymmetry parameter
,
high-energy photoelectron spectroscopy
,
lnearly polarized X-rays
, and
mean escape depth
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Yoshikawa, Hideki
,
Shinotsuka, Hiroshi
, and
Ueda, Ryuichi
Journal:
Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:
26/06/2020
Date Modified:
02/07/2021
電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討-, Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–
Description/Abstract:
電子線マイクロアナライザーは広く材料の分析に用いられ,定量分析法はZAF法としてほぼ確立されている.しかし,Mg-Ge合金においては,定量分析の結果MgとGeの濃度の合計120wt.% と異常な値を示した.しかも電子線の加速電圧が高くなるに従ってMgの定量値が上昇する.こ...
Keyword:
Mg-Ge alloy
,
ZAF
,
electron probe microanalyzer
, and
mass absorption coefficient
Resource Type:
Article
Author:
Nishio, Mitsuaki
,
Imai, Motoharu
,
Tanuma, Shigeo
,
Yoshikawa, HIdeki
, and
Isoda, Yukihiro
Journal:
Journal of Surface Analysis
Date Uploaded:
20/07/2020
Date Modified:
22/07/2020
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17
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The history of DICE and NIMS Digital Library
3
Keyword
Ultra Low Angle Incidence Ion Beam
3
Auger Depth Profiling Analysis
2
HfO2/Si
2
IoT
2
X-ray photoelectron spectroscopy
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10
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18
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In Copyright
8
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
6
Creative Commons BY Attribution 4.0 International
4
Computational methods
density functional theory or electronic structure
1
Data origin
simulations
1
Properties addressed
electrical -- dielectric constant and spectra
1
optical
1
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HfO2
2
FeNi/CoFeB/FeNi Thin Film
1
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2017
1
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2019
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Author
Yoshikawa, Hideki
7
Hideki Yoshikawa
5
YOSHIKAWA, Hideki
5
Bo Da
4
Shigeo Tanuma
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3
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Journal of Surface Analysis
4
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2
情報処理学会論文誌デジタルプラクティス
2
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1
Journal of Electron Spectroscopy and Related Phenomena
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