Index Catalog // MDR

Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Description/Abstract:: We have developed a framework for solving the inverse problem of X-ray photoelectron spectroscopy (XPS) by incorporating an XPS simulator...
Keyword:: Bayesian estimation, Exchange Monte Carlo method, SESSA, and X-ray photoelectron spectroscopy
Resource Type:: Article
Author:: Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, and Masato Okada
Journal:: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Date Uploaded:: 25/08/2023
Date Modified:: 25/08/2023

Machine learning approach for the prediction of electron inelastic mean free paths

Description/Abstract:: The prediction of electron inelastic mean free paths (IMFPs) from simple material parameters is a challenging problem in studies using el...
Keyword:: inelastic mean free path and machine learning
Resource Type:: Article
Author:: Xun Liu, Lihao Yang, Zhufeng Hou, Bo Da, Kenji Nagata, Hideki Yoshikawa, Shigeo Tanuma, Yang Sun, and Zejun Ding
Date Uploaded:: 11/04/2023

Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo

Description/Abstract:: Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characte...
Keyword:: Plasmon Energy Gain and Secondary Electron
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Yoshitomo Harada, Nguyen T. Cuong, Kazuhito Tsukagoshi, Jin Hu, Lihao Yang, Zejun Ding, Hideki Yoshikawa, and Shigeo Tanuma
Date Uploaded:: 11/04/2023
Date Modified:: 11/04/2023

Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Description/Abstract:: Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:: four-point probe technique, inelastic mean free path, and monolayer graphene
Resource Type:: Article
Author:: Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding
Date Uploaded:: 04/04/2023
Date Modified:: 05/04/2023

Virtual substrate method for nanomaterials characterization

Description/Abstract:: Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials...
Keyword:: Virtual substrate method
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Mahito Yamamoto, Yoshihiro Ueda, Kazuyuki Watanabe, Nguyen Thanh Cuong, Songlin Li, Kazuhito Tsukagoshi, Hideki Yoshikawa, Hideo Iwai, Shigeo Tanuma, Hongxuan Guo, Zhaoshun Gao, Xia Sun, and Zejun Ding
Date Uploaded:: 28/02/2023

Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion

Description/Abstract:: There is a need to develop an automatic spectral analysis method integrated with reference database as the reference database builds up. ...
Keyword:: X-ray photoelectron spectroscopy, Automatic spectrum analysis, Bayesian information criterion, and Multiple core level spectra
Resource Type:: Article
Author:: Murakami, Ryo, Tanaka, Hiromi, Shinotsuka Hiroshi, Nagata, Kenji, and Yoshikawa, Hideki
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 15/06/2022
Date Modified:: 17/06/2022

Automated information compression of XPS spectrum using information criteria

Description/Abstract:: We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:: X-ray photoelectron spectroscopy (XPS), Active Shirley method, Akaike information criterion (AIC), and Bayesian information criterion (BIC)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Yoshikawa, Hideki, Murakami, Ryo, Nakamura, Kazuki, Tanaka, Hiromi, and Yoshihara, Kazuhiro
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 10/06/2022
Date Modified:: 17/06/2022

IoT データ収集システムのデータアーキテクチャ

Description/Abstract:: With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:: データアーキテクチャ, IoT, データ収集システム, メタデータ, and XML スキーマ
Resource Type:: Article
Author:: MATSUNAMI, Shigeyuki, MATSUDA, Asahiko, CHIKYOW, Toyohiro, HARADA, Yoshitomo, and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 26/08/2021
Date Modified:: 26/08/2021

材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題

Description/Abstract:: In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:: 研究データ, データフロー, 相互利用 FAIR, 材料データプラットフォーム DICE, データリポジトリ, メタデータスキーマ, and マテリアル・インフォマティクス
Resource Type:: Article
Author:: TANIFUJI, Mikiko and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 25/08/2021
Date Modified:: 25/08/2021

English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2 /Si by the glancing angle ion beam sputtering method at an incident angle...
Keyword:: Auger Depth Profiling Analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Ogiwara, Toshiya, Nagata, Takahiro, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 19/08/2021
Date Modified:: 20/08/2021

Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Machine learning approach for the prediction of electron inelastic mean free paths

Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo

Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Virtual substrate method for nanomaterials characterization

Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion

Automated information compression of XPS spectrum using information criteria

IoT データ収集システムのデータアーキテクチャ

材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題

English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

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