Index Catalog // MDR

Description/Abstract:: We have developed a framework for solving the inverse problem of X-ray photoelectron spectroscopy (XPS) by incorporating an XPS simulator...
Keyword:: Bayesian estimation, Exchange Monte Carlo method, SESSA, and X-ray photoelectron spectroscopy
Resource Type:: Article
Author:: Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, and Masato Okada
Journal:: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Date Uploaded:: 25/08/2023
Date Modified:: 25/08/2023

Description/Abstract:: The prediction of electron inelastic mean free paths (IMFPs) from simple material parameters is a challenging problem in studies using el...
Keyword:: inelastic mean free path and machine learning
Resource Type:: Article
Author:: Xun Liu, Lihao Yang, Zhufeng Hou, Bo Da, Kenji Nagata, Hideki Yoshikawa, Shigeo Tanuma, Yang Sun, and Zejun Ding
Date Uploaded:: 11/04/2023

Description/Abstract:: Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characte...
Keyword:: Plasmon Energy Gain and Secondary Electron
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Yoshitomo Harada, Nguyen T. Cuong, Kazuhito Tsukagoshi, Jin Hu, Lihao Yang, Zejun Ding, Hideki Yoshikawa, and Shigeo Tanuma
Date Uploaded:: 11/04/2023
Date Modified:: 11/04/2023

Description/Abstract:: Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:: four-point probe technique, inelastic mean free path, and monolayer graphene
Resource Type:: Article
Author:: Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding
Date Uploaded:: 04/04/2023
Date Modified:: 05/04/2023

Description/Abstract:: Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials...
Keyword:: Virtual substrate method
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Mahito Yamamoto, Yoshihiro Ueda, Kazuyuki Watanabe, Nguyen Thanh Cuong, Songlin Li, Kazuhito Tsukagoshi, Hideki Yoshikawa, Hideo Iwai, Shigeo Tanuma, Hongxuan Guo, Zhaoshun Gao, Xia Sun, and Zejun Ding
Date Uploaded:: 28/02/2023

Description/Abstract:: There is a need to develop an automatic spectral analysis method integrated with reference database as the reference database builds up. ...
Keyword:: X-ray photoelectron spectroscopy, Automatic spectrum analysis, Bayesian information criterion, and Multiple core level spectra
Resource Type:: Article
Author:: Murakami, Ryo, Tanaka, Hiromi, Shinotsuka Hiroshi, Nagata, Kenji, and Yoshikawa, Hideki
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 15/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:: X-ray photoelectron spectroscopy (XPS), Active Shirley method, Akaike information criterion (AIC), and Bayesian information criterion (BIC)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Yoshikawa, Hideki, Murakami, Ryo, Nakamura, Kazuki, Tanaka, Hiromi, and Yoshihara, Kazuhiro
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 10/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2 /Si by the glancing angle ion beam sputtering method at an incident angle...
Keyword:: Auger Depth Profiling Analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Ogiwara, Toshiya, Nagata, Takahiro, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 19/08/2021
Date Modified:: 20/08/2021

Description/Abstract:: We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:: EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R
Journal:: Surface and Interface Analysis
Date Uploaded:: 31/07/2020
Date Modified:: 02/07/2021

Description/Abstract:: We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:: MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth
Resource Type:: Article
Author:: Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 26/06/2020
Date Modified:: 02/07/2021

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